Fingerprint
Dive into the research topics where Fekri Kharbash is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
-
A Cloud-based Brain-controlled Wheelchair with Autonomous Indoor Navigation System
Lakas, A., Kharbash, F. & Belkacem, A. N., 2021, 2021 International Wireless Communications and Mobile Computing, IWCMC 2021. Institute of Electrical and Electronics Engineers Inc., p. 1727-1733 7 p. (2021 International Wireless Communications and Mobile Computing, IWCMC 2021).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
10 Link opens in a new tab Citations (Scopus) -
When one should consider Schmitt trigger gates
Beiu, V., Ibrahim, W., Tache, M. & Kharbash, F., 2015, IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc., p. 682-685 4 p. 7388698. (IEEE-NANO 2015 - 15th International Conference on Nanotechnology).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
8 Link opens in a new tab Citations (Scopus) -
Enhancing the static noise margins by upsizing length for ultra-low voltage/power/energy gates
Tache, M., Beiu, V., Ibrahim, W., Kharbash, F. & Alioto, M., Mar 1 2014, In: Journal of Low Power Electronics. 10, 1, p. 137-148 12 p.Research output: Contribution to journal › Article › peer-review
11 Link opens in a new tab Citations (Scopus) -
On SRAM bit-cells once again
Tache, M., Kharbash, F. & Beiu, V., Dec 16 2014, 2014 10th International Conference on Innovations in Information Technology, IIT 2014. Institute of Electrical and Electronics Engineers Inc., p. 80-83 4 p. 6987566. (2014 10th International Conference on Innovations in Information Technology, IIT 2014).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
-
Reliability enhanced SRAM bit-cells
Beiu, V., Tache, M. & Kharbash, F., Nov 24 2014, Proceedings of the International Semiconductor Conference, CAS. Institute of Electrical and Electronics Engineers Inc., p. 229-232 4 p. 6966444. (Proceedings of the International Semiconductor Conference, CAS).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution