Calculated based on number of publications stored in Pure and citations from Scopus
20032022

Research activity per year

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Search results

  • 2009

    How much input vectors affect nano-circuit's reliability estimates

    Ibrahim, W., Beiu, V. & Amer, H., 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. p. 699-702 4 p. 5394482. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    11 Citations (Scopus)
  • On wires at low electron densities

    Beiu, V., Ibrahim, W. & Makki, R. Z., 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. p. 703-706 4 p. 5394862. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Citations (Scopus)
  • On wires driven by a few electrons

    Beiu, V., Ibrahim, W. & Makki, R. Z., 2009, 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09. 5290455. (2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • On wires holding a handful of electrons

    Beiu, V., Ibrahim, W. & Makki, R. Z., 2009, Nano-Net - 4th International ICST Conference, Nano-Net 2009, Proceedings. p. 259-269 11 p. (Lecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering; vol. 20 LNICST).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • PerfPred: A Web-based tool for exploring computer architecture design space

    Beg, A. & Ibrahim, W., Sep 2009, In: Computer Applications in Engineering Education. 17, 3, p. 305-313 9 p.

    Research output: Contribution to journalArticlepeer-review

    9 Citations (Scopus)
  • Relating reliability to circuit topology

    Beg, A. & Ibrahim, W., Dec 24 2009, 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09. 5290421. (2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    9 Citations (Scopus)
  • Reliability of NAND-2 CMOS gates from threshold voltage variations

    Ibrahim, W. & Beiu, V., 2009, 2009 International Conference on Innovations in Information Technology, IIT '09. p. 135-139 5 p. 5413631. (2009 International Conference on Innovations in Information Technology, IIT '09).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    13 Citations (Scopus)
  • Why should we care about input vectors?

    Ibrahim, W., Beiu, V. & Amer, H., 2009, 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09. 5290448. (2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    8 Citations (Scopus)
  • 2008

    A bayesian based EDA tool for accurate VLSI reliability evaluations

    Ibrahim, W., Beg, A. & Amer, H., Dec 1 2008, 2008 International Conference on Innovations in Information Technology, IIT 2008. p. 101-105 5 p. 4781735. (2008 International Conference on Innovations in Information Technology, IIT 2008).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    10 Citations (Scopus)
  • Does the brain really outperform rent's rule?

    Beiu, V. & Ibrahim, W., 2008, 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008. p. 640-643 4 p. 4541499. (Proceedings - IEEE International Symposium on Circuits and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    12 Citations (Scopus)
  • Impact of fading wireless channel on the performance of game theoretic power control algorithms for CDMA wireless data

    Hayajneh, M., Abdallah, C. & Ibrahim, W., 2008, AICCSA 08 - 6th IEEE/ACS International Conference on Computer Systems and Applications. p. 317-324 8 p. 4493552. (AICCSA 08 - 6th IEEE/ACS International Conference on Computer Systems and Applications).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)
  • Improving solver success in reaching feasibility for sets of nonlinear constraints

    Ibrahim, W. & Chinneck, J. W., May 2008, In: Computers and Operations Research. 35, 5, p. 1394-1411 18 p.

    Research output: Contribution to journalArticlepeer-review

    18 Citations (Scopus)
  • On Device-level Majority von Neumann Multiplexing

    Beiu, V., Ibrahim, W. & Lazarova-Molnar, S., Aug 5 2008, Encyclopedia of Artificial Inteligence. Dopico, J. R., De La Calle, J. D. & Sierra, A. P. (eds.). USA & UK: IGI Global, p. 471-479

    Research output: Chapter in Book/Report/Conference proceedingChapter

  • On teaching circuit reliability

    Beg, A. & Ibrahim, W., 2008, In: Proceedings - Frontiers in Education Conference, FIE. p. T3H12-T3H17 4720347.

    Research output: Contribution to journalConference articlepeer-review

    10 Citations (Scopus)
  • On the reliability of majority gates full adders

    Ibrahim, W., Beiu, V. & Sulieman, M. H., Jan 2008, In: IEEE Transactions on Nanotechnology. 7, 1, p. 56-67 12 p.

    Research output: Contribution to journalArticlepeer-review

    57 Citations (Scopus)
  • Utilizing synthesis to verify Boolean function models

    Beg, A., Prasad, P. W. C., Ibrahim, W. & Shama, E. A., 2008, 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008. p. 1576-1579 4 p. 4541733. (Proceedings - IEEE International Symposium on Circuits and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • 2007

    Accurate nano-circuits reliability evaluations based on combining numerical simulations with Monte Carlo

    Ibrahim, W., Beiu, V. & Lazarova-Molnar, S., 2007, Proceedings - IDT'07 The 2nd International Design and Test Workshop. p. 139-144 6 p. 4437447. (Proceedings - IDT'07 The 2nd International Design and Test Workshop).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)
  • A fresh look at majority multiplexing when devices get into the picture

    Beiu, V., Ibrahim, W. & Lazarova-Molnar, S., 2007, 2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings. p. 883-888 6 p. 4601325. (2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    13 Citations (Scopus)
  • A novel EDA tool for VLSI test vectors management

    Ibrahim, W., Oct 1 2007, In: Journal of Electronic Testing: Theory and Applications (JETTA). 23, 5, p. 421-434 14 p.

    Research output: Contribution to journalArticlepeer-review

  • A Strategy for Reliability Assessment of Future Nano-Circuits

    Lazarova-Molnar, S., Beiu, V. & Ibrahim, W., Jul 28 2007, 11th Conference on Proceedings of the 11th WSEAS International Conference on Circuits.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Long Live Small Fan-in Majority Gates - Their Reign Looks Like Coming

    Ibrahim, W. & Beiu, V., Jul 8 2007, IEEE International Conference on Application-specific Systems Architectures and Processors.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • On Computing Nano-Architectures Using Unreliable Nano-Device

    Beiu, V. & Ibrahim, W., May 30 2007, Nano and Molecular Electronics Handbook. Lyshevski, S. E. (ed.). Boca Raton, FL, USA: CRC Press / Taylor & Francis Group, p. 1-49

    Research output: Chapter in Book/Report/Conference proceedingChapter

  • On the reliability of four full adder cells

    Ibrahim, W., Beiu, V. & Alkhawwar, Y. A., 2007, Innovations'07: 4th International Conference on Innovations in Information Technology, IIT. IEEE Computer Society, p. 720-724 5 p. 4430508. (Innovations'07: 4th International Conference on Innovations in Information Technology, IIT).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)
  • Proxels for reliability assessment of future nano-architectures

    Lazarova-Molnar, S., Beiu, V. & Ibrahim, W., 2007, Proceedings - IDT'07 The 2nd International Design and Test Workshop. p. 88-89 2 p. 4437435. (Proceedings - IDT'07 The 2nd International Design and Test Workshop).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Reliability the fourth optimization pillar of nanoelectronics

    Lazarova-Molnar, S., Beiu, V. & Ibrahim, W., 2007, ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications. p. 73-76 4 p. 4728258. (ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)
  • Serial addition: Locally connected architectures

    Beiu, V., Aunet, S., Nyathi, J., Rydberg, R. R. & Ibrahim, W., 2007, In: IEEE Transactions on Circuits and Systems I: Regular Papers. 54, 11 SPEC. ISS., p. 2564-2579 16 p.

    Research output: Contribution to journalReview articlepeer-review

    16 Citations (Scopus)
  • What von Neumann did not say about multiplexing beyond gate failures - The gory details

    Beiu, V., Ibrahim, W. & Lazarova-Molnar, S., 2007, Computational and Ambient Intelligence - 9th International Work-Conference on Artificial Neural Networks, IWANN 2007, Proceedings. p. 487-496 10 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 4507 LNCS).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    13 Citations (Scopus)
  • Why nano-dsp will be fan-in constrained

    Ibrahim, W., Beiu, V. & Lazarova-Molnar, S., 2007, ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications. p. 317-320 4 p. 4728319. (ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 2006

    An adaptive genetic algorithm for VLSI test vector selection

    Ibrahim, W. & Amer, H., Nov 28 2006, Proceedings of the 15th IASTED International Conference on Applied Simulation and Modelling. p. 478-483 6 p. (Proceedings of the 15th IASTED International Conference on Applied Simulation and Modelling; vol. 2006).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • A two-phase genetic algorithm for VLSI test vector selection

    Ibrahim, W., Elchouemi, A. & Amer, H., Jan 1 2006, 2006 IEEE Congress on Evolutionary Computation, CEC 2006. IEEE Computer Society, p. 878-884 7 p. 1688404. (2006 IEEE Congress on Evolutionary Computation, CEC 2006).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • Gate failures effectively shape multiplexing

    Beiu, V., Ibrahim, W., Alkhawwar, Y. A. & Sulieman, M. H., 2006, Proceedings - 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT'06. p. 29-37 9 p. 4030913. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    15 Citations (Scopus)
  • Novel heuristic and genetic algorithms for the VLSI test coverage problem

    Ibrahim, W., El-Chouemi, A. & El-Sayed, H., 2006, IEEE International Conference on Computer Systems and Applications, 2006. IEEE Computer Society, p. 402-408 7 p. 1618387. (IEEE International Conference on Computer Systems and Applications, 2006; vol. 2006).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • 2005

    QoS satisfaction based charging and resource management policy for next generation wireless networks

    Ibrahim, W., Chinneck, J. W., Periyalwar, S. & El-Sayed, H., Dec 1 2005, 2005 International Conference on Wireless Networks, Communications and Mobile Computing. p. 868-873 6 p. 1549526. (2005 International Conference on Wireless Networks, Communications and Mobile Computing; vol. 2).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)
  • 2003

    A QoS-based charging and resource allocation framework for next generation wireless networks

    Ibrahim, W., Chinneck, J. W. & Periyalwar, S., Nov 2003, In: Wireless Communications and Mobile Computing. 3, 7, p. 895-906 12 p.

    Research output: Contribution to journalArticlepeer-review

    Open Access
    8 Citations (Scopus)