Calculated based on number of publications stored in Pure and citations from Scopus
20032022

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  • 2022

    Embedded Course Level Assessment for Effective Assessment of Program Learning Outcomes

    Ibrahim, W., Sweedan, A., Ibrahim, H., Marzouk, S., Ibrahim, W. & Zoubeidi, T., 2022, HEAd 2022 - 8th International Conference on Higher Education Advances. Universidad Politecnica de Valencia., p. 57-64 8 p. (International Conference on Higher Education Advances; vol. 2022-June).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Open Access
  • 2021

    Assuring the Quality of the Course Learning Outcomes Assessment Process

    Ibrahim, W. & Amer, H., 2021, HEAd 2021 - 7th International Conference on Higher Education Advances. Universidad Politecnica de Valencia., p. 763-771 9 p. (International Conference on Higher Education Advances).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Open Access
  • 2020

    Gamification in online educational systems

    Ibrahim, H. & Ibrahim, W., 2020, HEAd 2020 - 6th International Conference on Higher Education Advances. Universitat Politecnica de Valencia, p. 1217-1224 8 p. (International Conference on Higher Education Advances; vol. 2020-June).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Open Access
    1 Citation (Scopus)
  • 2019

    An Affordable System for Remotely Monitoring Water Quality in Residential Water Tanks

    Al Khaili, A., Al Mamari, A., Amer, H. & Ibrahim, W., Jan 8 2019, Proceedings of the 2018 13th International Conference on Innovations in Information Technology, IIT 2018. Institute of Electrical and Electronics Engineers Inc., p. 36-41 6 p. 8605978. (Proceedings of the 2018 13th International Conference on Innovations in Information Technology, IIT 2018).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • An electronic design automation tool for efficiently improving the reliability of nano-circuits

    Ibrahim, W. & Amer, H., Jun 1 2019, Proceedings - European Council for Modelling and Simulation, ECMS. Iacono, M., Palmieri, F., Gribaudo, M., Ficco, M., Nolle, L. & Peytchev, E. (eds.). 1 ed. European Council for Modelling and Simulation, p. 184-189 6 p. (Proceedings - European Council for Modelling and Simulation, ECMS; vol. 33, no. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 2015

    When one should consider Schmitt trigger gates

    Beiu, V., Ibrahim, W., Tache, M. & Kharbash, F., 2015, IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc., p. 682-685 4 p. 7388698. (IEEE-NANO 2015 - 15th International Conference on Nanotechnology).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    4 Citations (Scopus)
  • 2014

    Nanoscale education for semiconductor design

    Ibrahim, W. & Atif, Y., 2014, CSEDU 2014 - Proceedings of the 6th International Conference on Computer Supported Education. SciTePress, p. 520-525 6 p. (CSEDU 2014 - Proceedings of the 6th International Conference on Computer Supported Education; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Open Access
  • On ultra-low power hybrid NEMS-CMOS

    Beiu, V., Ibrahim, W., Tache, M. & King Liu, T. J., Nov 26 2014, Proceedings of the IEEE Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc., p. 201-206 6 p. 6968045. (Proceedings of the IEEE Conference on Nanotechnology).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)
  • Using the iPad as a pedagogical tool to enhance the learning experince for novice programing students

    Amer, H. & Ibrahim, W., Jan 1 2014, 2014 IEEE Global Engineering Education Conference: Engineering Education Towards Openness and Sustainability, IEEE EDUCON 2014. IEEE Computer Society, p. 178-183 6 p. 6826087. (IEEE Global Engineering Education Conference, EDUCON).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    7 Citations (Scopus)
  • 2013

    Accurate and effective algorithm for estimating the reliability of digital combinational circuits

    Ibrahim, W., May 3 2013, Proceedings of the 2013 Spring Simulation Multiconference, SpringSim 2013 - 46th Annual Simulation Symposium, ANSS 2013. 2 ed. p. 65-72 8 p. (Simulation Series; vol. 45, no. 2).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • Enabling sizing for enhancing the static noise margins

    Beiu, V., Beg, A., Ibrahim, W., Kharbash, F. & Alioto, M., 2013, Proceedings of the 14th International Symposium on Quality Electronic Design, ISQED 2013. p. 278-286 9 p. 6523623. (Proceedings - International Symposium on Quality Electronic Design, ISQED).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    17 Citations (Scopus)
  • On Schmitt trigger and other inverters

    Ibrahim, W., Beiu, V., Tache, M. & Kharbash, F., 2013, 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013. Institute of Electrical and Electronics Engineers Inc., p. 29-32 4 p. 6815337. (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)
  • On upsizing length and noise margins

    Beiu, V., Tache, M., Ibrahim, W., Kharbash, F. & Alioto, M., 2013, CAS 2013 Proceedings - 2013 International Semiconductor Conference. p. 219-222 4 p. 6688659. (Proceedings of the International Semiconductor Conference, CAS; vol. 2).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Citations (Scopus)
  • Teaching ethical hacking in information security curriculum: A case study

    Trabelsi, Z. & Ibrahim, W., Aug 7 2013, 2013 IEEE Global Engineering Education Conference, EDUCON 2013. p. 130-137 8 p. 6530097. (IEEE Global Engineering Education Conference, EDUCON).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    8 Citations (Scopus)
  • Using body bias when upsizing length for maximizing the static noise margins of CMOS gates

    Kharbash, F., Beiu, V., Tache, M. & Ibrahim, W., 2013, 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013. Institute of Electrical and Electronics Engineers Inc., p. 409-412 4 p. 6815441. (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)
  • 2012

    Low power and highly reliable gates using arrays of optimally sized transistors

    Beiu, V., Iordǎconiu, L., Beg, A., Ibrahim, W. & Kharbash, F., 2012, 2012 International Semiconductor Conference, CAS 2012 Proceedings. p. 433-436 4 p. 6400738. (Proceedings of the International Semiconductor Conference, CAS; vol. 2).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)
  • Towards ultra-low voltage/power using unconventionally sized arrays of transistors

    Beiu, V., Beg, A., Ibrahim, W. & Kharbash, F., 2012, 2012 12th IEEE International Conference on Nanotechnology, NANO 2012. 6322071. (Proceedings of the IEEE Conference on Nanotechnology).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    7 Citations (Scopus)
  • Unconventional transistor sizing for reducing power alleviates threshold voltage variations

    Beg, A., Beiu, V. & Ibrahim, W., 2012, 2012 International Semiconductor Conference, CAS 2012 Proceedings. p. 429-432 4 p. 6400739. (Proceedings of the International Semiconductor Conference, CAS; vol. 2).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Citations (Scopus)
  • 2011

    Atto Joule CMOS Gates Using Reversed Sizing and W/L Swapping

    Beg, A., Beiu, V. & Ibrahim, W., Jun 26 2011, IEEE 9th International New Circuits and Systems Conference.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Atto-Joule gates for the whole voltage range

    Beiu, V., Beg, A. & Ibrahim, W., 2011, 2011 11th IEEE International Conference on Nanotechnology, NANO 2011. p. 1424-1429 6 p. 6144399. (Proceedings of the IEEE Conference on Nanotechnology).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    12 Citations (Scopus)
  • Highly reliable and low-power full adder cell

    Ibrahim, W., Beg, A. & Beiu, V., 2011, 2011 11th IEEE International Conference on Nanotechnology, NANO 2011. p. 500-503 4 p. 6144434. (Proceedings of the IEEE Conference on Nanotechnology).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    12 Citations (Scopus)
  • Minimizing communication power using near-neighbor axon-inspired lattices

    Beiu, V., Zhang, L., Ibrahim, W. & Tache, M., 2011, 2011 11th IEEE International Conference on Nanotechnology, NANO 2011. p. 426-430 5 p. 6144502. (Proceedings of the IEEE Conference on Nanotechnology).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    7 Citations (Scopus)
  • Notice of Retraction: Reliability optimized CMOS gates

    Ibrahim, W., Beiu, V. & Amer, H., 2011, 2011 11th IEEE International Conference on Nanotechnology, NANO 2011. IEEE Computer Society, p. 730-734 5 p. 6144517. (Proceedings of the IEEE Conference on Nanotechnology).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)
  • On axon-inspired communications

    Beiu, V., Ibrahim, W., Beg, A., Zhang, L. & Tache, M., 2011, 2011 20th European Conference on Circuit Theory and Design, ECCTD 2011. p. 789-792 4 p. 6043841. (2011 20th European Conference on Circuit Theory and Design, ECCTD 2011).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Citations (Scopus)
  • 2010

    Device-level reliability of several full adder cells

    Ibrahim, W. & Beiu, V., 2010, 2010 10th IEEE Conference on Nanotechnology, NANO 2010. p. 1082-1087 6 p. 5697865. (2010 10th IEEE Conference on Nanotechnology, NANO 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • From transistor variations to NAND-2 multiplexing

    Beiu, V. & Ibrahim, W., 2010, 2010 10th IEEE Conference on Nanotechnology, NANO 2010. p. 1076-1081 6 p. 5697864. (2010 10th IEEE Conference on Nanotechnology, NANO 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • Low-power and highly reliable logic gates transistor-level optimizations

    Sulieman, M. H., Beiu, V. & Ibrahim, W., 2010, 2010 10th IEEE Conference on Nanotechnology, NANO 2010. p. 254-257 4 p. 5697892. (2010 10th IEEE Conference on Nanotechnology, NANO 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    20 Citations (Scopus)
  • On NOR-2 von Neumann multiplexing

    Ibrahim, W., Beiu, V. & Beg, A., 2010, IDT'10 - 2010 5th International Design and Test Workshop, Proceedings. p. 67-72 6 p. 5724410. (IDT'10 - 2010 5th International Design and Test Workshop, Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    4 Citations (Scopus)
  • 2009

    A bayesian-based EDA tool for nano-circuits reliability calculations

    Ibrahim, W. & Beiu, V., 2009, Nano-Net - 4th International ICST Conference, Nano-Net 2009, Proceedings. p. 276-284 9 p. (Lecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering; vol. 20 LNICST).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    10 Citations (Scopus)
  • How much input vectors affect nano-circuit's reliability estimates

    Ibrahim, W., Beiu, V. & Amer, H., 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. p. 699-702 4 p. 5394482. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    11 Citations (Scopus)
  • On wires at low electron densities

    Beiu, V., Ibrahim, W. & Makki, R. Z., 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. p. 703-706 4 p. 5394862. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Citations (Scopus)
  • On wires driven by a few electrons

    Beiu, V., Ibrahim, W. & Makki, R. Z., 2009, 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09. 5290455. (2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • On wires holding a handful of electrons

    Beiu, V., Ibrahim, W. & Makki, R. Z., 2009, Nano-Net - 4th International ICST Conference, Nano-Net 2009, Proceedings. p. 259-269 11 p. (Lecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering; vol. 20 LNICST).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Relating reliability to circuit topology

    Beg, A. & Ibrahim, W., Dec 24 2009, 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09. 5290421. (2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    9 Citations (Scopus)
  • Reliability of NAND-2 CMOS gates from threshold voltage variations

    Ibrahim, W. & Beiu, V., 2009, 2009 International Conference on Innovations in Information Technology, IIT '09. p. 135-139 5 p. 5413631. (2009 International Conference on Innovations in Information Technology, IIT '09).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    13 Citations (Scopus)
  • Why should we care about input vectors?

    Ibrahim, W., Beiu, V. & Amer, H., 2009, 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09. 5290448. (2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    8 Citations (Scopus)
  • 2008

    A bayesian based EDA tool for accurate VLSI reliability evaluations

    Ibrahim, W., Beg, A. & Amer, H., Dec 1 2008, 2008 International Conference on Innovations in Information Technology, IIT 2008. p. 101-105 5 p. 4781735. (2008 International Conference on Innovations in Information Technology, IIT 2008).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    10 Citations (Scopus)
  • Does the brain really outperform rent's rule?

    Beiu, V. & Ibrahim, W., 2008, 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008. p. 640-643 4 p. 4541499. (Proceedings - IEEE International Symposium on Circuits and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    12 Citations (Scopus)
  • Impact of fading wireless channel on the performance of game theoretic power control algorithms for CDMA wireless data

    Hayajneh, M., Abdallah, C. & Ibrahim, W., 2008, AICCSA 08 - 6th IEEE/ACS International Conference on Computer Systems and Applications. p. 317-324 8 p. 4493552. (AICCSA 08 - 6th IEEE/ACS International Conference on Computer Systems and Applications).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)
  • Utilizing synthesis to verify Boolean function models

    Beg, A., Prasad, P. W. C., Ibrahim, W. & Shama, E. A., 2008, 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008. p. 1576-1579 4 p. 4541733. (Proceedings - IEEE International Symposium on Circuits and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • 2007

    Accurate nano-circuits reliability evaluations based on combining numerical simulations with Monte Carlo

    Ibrahim, W., Beiu, V. & Lazarova-Molnar, S., 2007, Proceedings - IDT'07 The 2nd International Design and Test Workshop. p. 139-144 6 p. 4437447. (Proceedings - IDT'07 The 2nd International Design and Test Workshop).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)
  • A fresh look at majority multiplexing when devices get into the picture

    Beiu, V., Ibrahim, W. & Lazarova-Molnar, S., 2007, 2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings. p. 883-888 6 p. 4601325. (2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    13 Citations (Scopus)
  • A Strategy for Reliability Assessment of Future Nano-Circuits

    Lazarova-Molnar, S., Beiu, V. & Ibrahim, W., Jul 28 2007, 11th Conference on Proceedings of the 11th WSEAS International Conference on Circuits.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Long Live Small Fan-in Majority Gates - Their Reign Looks Like Coming

    Ibrahim, W. & Beiu, V., Jul 8 2007, IEEE International Conference on Application-specific Systems Architectures and Processors.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • On the reliability of four full adder cells

    Ibrahim, W., Beiu, V. & Alkhawwar, Y. A., 2007, Innovations'07: 4th International Conference on Innovations in Information Technology, IIT. IEEE Computer Society, p. 720-724 5 p. 4430508. (Innovations'07: 4th International Conference on Innovations in Information Technology, IIT).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)
  • Proxels for reliability assessment of future nano-architectures

    Lazarova-Molnar, S., Beiu, V. & Ibrahim, W., 2007, Proceedings - IDT'07 The 2nd International Design and Test Workshop. p. 88-89 2 p. 4437435. (Proceedings - IDT'07 The 2nd International Design and Test Workshop).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Reliability the fourth optimization pillar of nanoelectronics

    Lazarova-Molnar, S., Beiu, V. & Ibrahim, W., 2007, ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications. p. 73-76 4 p. 4728258. (ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)
  • What von Neumann did not say about multiplexing beyond gate failures - The gory details

    Beiu, V., Ibrahim, W. & Lazarova-Molnar, S., 2007, Computational and Ambient Intelligence - 9th International Work-Conference on Artificial Neural Networks, IWANN 2007, Proceedings. p. 487-496 10 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 4507 LNCS).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    13 Citations (Scopus)
  • Why nano-dsp will be fan-in constrained

    Ibrahim, W., Beiu, V. & Lazarova-Molnar, S., 2007, ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications. p. 317-320 4 p. 4728319. (ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 2006

    An adaptive genetic algorithm for VLSI test vector selection

    Ibrahim, W. & Amer, H., Nov 28 2006, Proceedings of the 15th IASTED International Conference on Applied Simulation and Modelling. p. 478-483 6 p. (Proceedings of the 15th IASTED International Conference on Applied Simulation and Modelling; vol. 2006).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution