Walid Ibrahim

Research output

Research output per year 2003 2007 2008 2009 2011 2013 2022

• 54 Conference contribution
• 20 Article
• 7 Chapter
• 1 Conference article
• 2 More
  • 1 Editorial
  • 1 Review article

Research output per year

Research output per year

Search results

• 2022

  Embedded Course Level Assessment for Effective Assessment of Program Learning Outcomes

  Ibrahim, W., Sweedan, A., Ibrahim, H., Marzouk, S., Ibrahim, W. & Zoubeidi, T., 2022, HEAd 2022 - 8th International Conference on Higher Education Advances. Universidad Politecnica de Valencia., p. 57-64 8 p. (International Conference on Higher Education Advances; vol. 2022-June).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  Open Access

  • learning 100%
  • quality assurance 47%
  • instructor 36%
  • student 36%
  • educator 30%
• 2021

  Assuring the Quality of the Course Learning Outcomes Assessment Process

  Ibrahim, W. & Amer, H., 2021, HEAd 2021 - 7th International Conference on Higher Education Advances. Universidad Politecnica de Valencia., p. 763-771 9 p. (International Conference on Higher Education Advances).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  Open Access

  • learning 100%
  • responsibility 68%
  • infrastructure 58%
  • educator 51%
  • quality assurance 40%
• 2020

  Gamification in online educational systems

  Ibrahim, H. & Ibrahim, W., 2020, HEAd 2020 - 6th International Conference on Higher Education Advances. Universitat Politecnica de Valencia, p. 1217-1224 8 p. (International Conference on Higher Education Advances; vol. 2020-June).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  Open Access

  • educational system 100%
  • personalization 61%
  • networking 23%
  • education system 23%
  • student 20%
  1 Citation (Scopus)
• 2019

  An Affordable System for Remotely Monitoring Water Quality in Residential Water Tanks

  Al Khaili, A., Al Mamari, A., Amer, H. & Ibrahim, W., Jan 8 2019, Proceedings of the 2018 13th International Conference on Innovations in Information Technology, IIT 2018. Institute of Electrical and Electronics Engineers Inc., p. 36-41 6 p. 8605978. (Proceedings of the 2018 13th International Conference on Innovations in Information Technology, IIT 2018).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Water Quality 100%
  • Water tanks 80%
  • Water quality 78%
  • Monitoring 47%
  • Water 46%

• An electronic design automation tool for efficiently improving the reliability of nano-circuits

  Ibrahim, W. & Amer, H., Jun 1 2019, Proceedings - European Council for Modelling and Simulation, ECMS. Iacono, M., Palmieri, F., Gribaudo, M., Ficco, M., Nolle, L. & Peytchev, E. (eds.). 1 ed. European Council for Modelling and Simulation, p. 184-189 6 p. (Proceedings - European Council for Modelling and Simulation, ECMS; vol. 33, no. 1).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Design Automation 100%
  • Electronic design automation 81%
  • Electronics 57%
  • Networks (circuits) 30%
  • Power Consumption 29%
• 2015

  When one should consider Schmitt trigger gates

  Beiu, V., Ibrahim, W., Tache, M. & Kharbash, F., 2015, IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc., p. 682-685 4 p. 7388698. (IEEE-NANO 2015 - 15th International Conference on Nanotechnology).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Logic gates 100%
  • Voltage 60%
  • Hysteresis 41%
  • Static random access storage 23%
  • Electric potential 21%
  4 Citations (Scopus)
• 2014

  Nanoscale education for semiconductor design

  Ibrahim, W. & Atif, Y., 2014, CSEDU 2014 - Proceedings of the 6th International Conference on Computer Supported Education. SciTePress, p. 520-525 6 p. (CSEDU 2014 - Proceedings of the 6th International Conference on Computer Supported Education; vol. 1).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  Open Access

  • nanotechnology 100%
  • manufacturing 32%
  • education 27%
  • resources 23%
  • learning 18%

• On ultra-low power hybrid NEMS-CMOS

  Beiu, V., Ibrahim, W., Tache, M. & King Liu, T. J., Nov 26 2014, Proceedings of the IEEE Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc., p. 201-206 6 p. 6968045. (Proceedings of the IEEE Conference on Nanotechnology).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Voltage 100%
  • Switch 95%
  • CMOS 78%
  • switches 72%
  • Power Consumption 71%
  2 Citations (Scopus)

• Using the iPad as a pedagogical tool to enhance the learning experince for novice programing students

  Amer, H. & Ibrahim, W., Jan 1 2014, 2014 IEEE Global Engineering Education Conference: Engineering Education Towards Openness and Sustainability, IEEE EDUCON 2014. IEEE Computer Society, p. 178-183 6 p. 6826087. (IEEE Global Engineering Education Conference, EDUCON).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Programming 100%
  • Student Evaluation of Teaching 99%
  • Learning Difficulties 90%
  • Students 76%
  • Mental Models 61%
  7 Citations (Scopus)
• 2013

  Accurate and effective algorithm for estimating the reliability of digital combinational circuits

  Ibrahim, W., May 3 2013, Proceedings of the 2013 Spring Simulation Multiconference, SpringSim 2013 - 46th Annual Simulation Symposium, ANSS 2013. 2 ed. p. 65-72 8 p. (Simulation Series; vol. 45, no. 2).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Combinatorial circuits 100%
  • Digital circuits 86%
  • Networks (circuits) 34%
  • Defects 10%
  • Geometry 9%
  1 Citation (Scopus)

• Enabling sizing for enhancing the static noise margins

  Beiu, V., Beg, A., Ibrahim, W., Kharbash, F. & Alioto, M., 2013, Proceedings of the 14th International Symposium on Quality Electronic Design, ISQED 2013. p. 278-286 9 p. 6523623. (Proceedings - International Symposium on Quality Electronic Design, ISQED).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electric potential 100%
  • Transistors 66%
  • Threshold voltage 42%
  • Networks (circuits) 21%
  17 Citations (Scopus)

• On Schmitt trigger and other inverters

  Ibrahim, W., Beiu, V., Tache, M. & Kharbash, F., 2013, 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013. Institute of Electrical and Electronics Engineers Inc., p. 29-32 4 p. 6815337. (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Static random access storage 100%
  • Electric potential 92%
  • Hysteresis 85%
  • Feedback 56%
  5 Citations (Scopus)

• On upsizing length and noise margins

  Beiu, V., Tache, M., Ibrahim, W., Kharbash, F. & Alioto, M., 2013, CAS 2013 Proceedings - 2013 International Semiconductor Conference. p. 219-222 4 p. 6688659. (Proceedings of the International Semiconductor Conference, CAS; vol. 2).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • margins 100%
  • sizing 74%
  • Voltage 66%
  • Length 54%
  • Power and Energy 54%
  6 Citations (Scopus)

• Teaching ethical hacking in information security curriculum: A case study

  Trabelsi, Z. & Ibrahim, W., Aug 7 2013, 2013 IEEE Global Engineering Education Conference, EDUCON 2013. p. 130-137 8 p. 6530097. (IEEE Global Engineering Education Conference, EDUCON).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • denial of services 100%
  • Denial 80%
  • Denial-of-service attack 74%
  • Curricula 67%
  • Curriculum 64%
  8 Citations (Scopus)

• Using body bias when upsizing length for maximizing the static noise margins of CMOS gates

  Kharbash, F., Beiu, V., Tache, M. & Ibrahim, W., 2013, 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013. Institute of Electrical and Electronics Engineers Inc., p. 409-412 4 p. 6815441. (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Transistors 100%
  • Power and Energy 69%
  • Threshold voltage 64%
  • Electric potential 60%
  2 Citations (Scopus)
• 2012

  Low power and highly reliable gates using arrays of optimally sized transistors

  Beiu, V., Iordǎconiu, L., Beg, A., Ibrahim, W. & Kharbash, F., 2012, 2012 International Semiconductor Conference, CAS 2012 Proceedings. p. 433-436 4 p. 6400738. (Proceedings of the International Semiconductor Conference, CAS; vol. 2).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • sizing 100%
  • Threshold voltage 90%
  • Transistors 70%
  • transistors 65%
  • Voltage 59%
  2 Citations (Scopus)

• Towards ultra-low voltage/power using unconventionally sized arrays of transistors

  Beiu, V., Beg, A., Ibrahim, W. & Kharbash, F., 2012, 2012 12th IEEE International Conference on Nanotechnology, NANO 2012. 6322071. (Proceedings of the IEEE Conference on Nanotechnology).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • sizing 100%
  • Threshold voltage 90%
  • low voltage 80%
  • Transistors 70%
  • transistors 65%
  7 Citations (Scopus)

• Unconventional transistor sizing for reducing power alleviates threshold voltage variations

  Beg, A., Beiu, V. & Ibrahim, W., 2012, 2012 International Semiconductor Conference, CAS 2012 Proceedings. p. 429-432 4 p. 6400739. (Proceedings of the International Semiconductor Conference, CAS; vol. 2).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • sizing 100%
  • Threshold voltage 90%
  • threshold voltage 77%
  • Transistors 70%
  • transistors 65%
  6 Citations (Scopus)
• 2011

  Atto Joule CMOS Gates Using Reversed Sizing and W/L Swapping

  Beg, A., Beiu, V. & Ibrahim, W., Jun 26 2011, IEEE 9th International New Circuits and Systems Conference.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • sizing 100%
  • product 21%
  • leakage 20%
  • energy 11%
  • comparison 9%

• Atto-Joule gates for the whole voltage range

  Beiu, V., Beg, A. & Ibrahim, W., 2011, 2011 11th IEEE International Conference on Nanotechnology, NANO 2011. p. 1424-1429 6 p. 6144399. (Proceedings of the IEEE Conference on Nanotechnology).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • inverters 100%
  • CMOS 86%
  • Voltage 70%
  • electric potential 52%
  • Electric potential 49%
  12 Citations (Scopus)

• Highly reliable and low-power full adder cell

  Ibrahim, W., Beg, A. & Beiu, V., 2011, 2011 11th IEEE International Conference on Nanotechnology, NANO 2011. p. 500-503 4 p. 6144434. (Proceedings of the IEEE Conference on Nanotechnology).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • adding circuits 100%
  • Limiting Current 77%
  • Adders 70%
  • Voltage 46%
  • cells 34%
  12 Citations (Scopus)

• Minimizing communication power using near-neighbor axon-inspired lattices

  Beiu, V., Zhang, L., Ibrahim, W. & Tache, M., 2011, 2011 11th IEEE International Conference on Nanotechnology, NANO 2011. p. 426-430 5 p. 6144502. (Proceedings of the IEEE Conference on Nanotechnology).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Axons 100%
  • axons 86%
  • Communication 61%
  • communication 56%
  • Wire 50%
  7 Citations (Scopus)

• Notice of Retraction: Reliability optimized CMOS gates

  Ibrahim, W., Beiu, V. & Amer, H., 2011, 2011 11th IEEE International Conference on Nanotechnology, NANO 2011. IEEE Computer Society, p. 730-734 5 p. 6144517. (Proceedings of the IEEE Conference on Nanotechnology).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • CMOS 100%
  • Transistors 95%
  • transistors 88%
  • Semiconductor 85%
  • Industry 82%
  5 Citations (Scopus)

• On axon-inspired communications

  Beiu, V., Ibrahim, W., Beg, A., Zhang, L. & Tache, M., 2011, 2011 20th European Conference on Circuit Theory and Design, ECCTD 2011. p. 789-792 4 p. 6043841. (2011 20th European Conference on Circuit Theory and Design, ECCTD 2011).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Axons 100%
  • Wire 50%
  • Communication 34%
  • Ions 24%
  • Electric power utilization 19%
  6 Citations (Scopus)
• 2010

  Device-level reliability of several full adder cells

  Ibrahim, W. & Beiu, V., 2010, 2010 10th IEEE Conference on Nanotechnology, NANO 2010. p. 1082-1087 6 p. 5697865. (2010 10th IEEE Conference on Nanotechnology, NANO 2010).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • cells 100%
  • threshold voltage 58%
  • CMOS 55%
  • tradeoffs 36%
  • electronics 32%

• From transistor variations to NAND-2 multiplexing

  Beiu, V. & Ibrahim, W., 2010, 2010 10th IEEE Conference on Nanotechnology, NANO 2010. p. 1076-1081 6 p. 5697864. (2010 10th IEEE Conference on Nanotechnology, NANO 2010).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • multiplexing 100%
  • transistors 82%
  • redundancy 51%
  • reviewing 25%
  • threshold voltage 19%
  1 Citation (Scopus)

• Low-power and highly reliable logic gates transistor-level optimizations

  Sulieman, M. H., Beiu, V. & Ibrahim, W., 2010, 2010 10th IEEE Conference on Nanotechnology, NANO 2010. p. 254-257 4 p. 5697892. (2010 10th IEEE Conference on Nanotechnology, NANO 2010).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • logic 100%
  • transistors 82%
  • optimization 67%
  • CMOS 39%
  • inverters 36%
  20 Citations (Scopus)

• On NOR-2 von Neumann multiplexing

  Ibrahim, W., Beiu, V. & Beg, A., 2010, IDT'10 - 2010 5th International Design and Test Workshop, Proceedings. p. 67-72 6 p. 5724410. (IDT'10 - 2010 5th International Design and Test Workshop, Proceedings).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Multiplexing 100%
  • Threshold voltage 53%
  • Transistors 41%
  • Schematic diagrams 27%
  • Topology 16%
  4 Citations (Scopus)
• 2009

  A bayesian-based EDA tool for nano-circuits reliability calculations

  Ibrahim, W. & Beiu, V., 2009, Nano-Net - 4th International ICST Conference, Nano-Net 2009, Proceedings. p. 276-284 9 p. (Lecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering; vol. 20 LNICST).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Networks (circuits) 100%
  • Semiconductor materials 20%
  • Defects 15%
  • Industry 9%
  10 Citations (Scopus)

• How much input vectors affect nano-circuit's reliability estimates

  Ibrahim, W., Beiu, V. & Amer, H., 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. p. 699-702 4 p. 5394482. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Simulation 100%
  • Networks (circuits) 87%
  • Defects 18%
  11 Citations (Scopus)

• On wires at low electron densities

  Beiu, V., Ibrahim, W. & Makki, R. Z., 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. p. 703-706 4 p. 5394862. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Carrier concentration 100%
  • Communication 64%
  • Electron Density 64%
  • Wire 52%
  • Network-on-chip 11%
  6 Citations (Scopus)

• On wires driven by a few electrons

  Beiu, V., Ibrahim, W. & Makki, R. Z., 2009, 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09. 5290455. (2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electrons 100%
  • Wire 74%
  • Communication 24%
  • Network-on-chip 18%
  • Reliability analysis 16%
  1 Citation (Scopus)

• On wires holding a handful of electrons

  Beiu, V., Ibrahim, W. & Makki, R. Z., 2009, Nano-Net - 4th International ICST Conference, Nano-Net 2009, Proceedings. p. 259-269 11 p. (Lecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering; vol. 20 LNICST).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electrons 100%
  • Wire 74%
  • Network-on-chip 16%
  • Failure analysis 12%
  • Defects 9%

• Relating reliability to circuit topology

  Beg, A. & Ibrahim, W., Dec 24 2009, 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09. 5290421. (2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electric network topology 100%
  • Networks (circuits) 44%
  • Bayesian networks 11%
  • Reliability analysis 11%
  9 Citations (Scopus)

• Reliability of NAND-2 CMOS gates from threshold voltage variations

  Ibrahim, W. & Beiu, V., 2009, 2009 International Conference on Innovations in Information Technology, IIT '09. p. 135-139 5 p. 5413631. (2009 International Conference on Innovations in Information Technology, IIT '09).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Threshold voltage 100%
  • Logic gates 54%
  • Transistors 38%
  • Electric potential 23%
  • Failure analysis 19%
  13 Citations (Scopus)

• Why should we care about input vectors?

  Ibrahim, W., Beiu, V. & Amer, H., 2009, 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09. 5290448. (2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Networks (circuits) 100%
  • Defects 31%
  8 Citations (Scopus)
• 2008

  A bayesian based EDA tool for accurate VLSI reliability evaluations

  Ibrahim, W., Beg, A. & Amer, H., Dec 1 2008, 2008 International Conference on Innovations in Information Technology, IIT 2008. p. 101-105 5 p. 4781735. (2008 International Conference on Innovations in Information Technology, IIT 2008).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Networks (circuits) 100%
  • Semiconductor materials 53%
  • Defects 41%
  • Industry 26%
  10 Citations (Scopus)

• Does the brain really outperform rent's rule?

  Beiu, V. & Ibrahim, W., 2008, 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008. p. 640-643 4 p. 4541499. (Proceedings - IEEE International Symposium on Circuits and Systems).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Brain 100%
  • Topology 40%
  12 Citations (Scopus)

• Impact of fading wireless channel on the performance of game theoretic power control algorithms for CDMA wireless data

  Hayajneh, M., Abdallah, C. & Ibrahim, W., 2008, AICCSA 08 - 6th IEEE/ACS International Conference on Computer Systems and Applications. p. 317-324 8 p. 4493552. (AICCSA 08 - 6th IEEE/ACS International Conference on Computer Systems and Applications).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Fading (radio) 100%
  • Code division multiple access 73%
  • Fading channels 71%
  • Power control 71%
  3 Citations (Scopus)

• Utilizing synthesis to verify Boolean function models

  Beg, A., Prasad, P. W. C., Ibrahim, W. & Shama, E. A., 2008, 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008. p. 1576-1579 4 p. 4541733. (Proceedings - IEEE International Symposium on Circuits and Systems).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Boolean functions 100%
  • Binary decision diagrams 35%
  • Analytical models 22%
  • Computer hardware 15%
  • Networks (circuits) 14%
  1 Citation (Scopus)
• 2007

  Accurate nano-circuits reliability evaluations based on combining numerical simulations with Monte Carlo

  Ibrahim, W., Beiu, V. & Lazarova-Molnar, S., 2007, Proceedings - IDT'07 The 2nd International Design and Test Workshop. p. 139-144 6 p. 4437447. (Proceedings - IDT'07 The 2nd International Design and Test Workshop).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • circuit reliability 100%
  • evaluation 33%
  • Networks (circuits) 29%
  • Computer simulation 29%
  • simulation 20%
  2 Citations (Scopus)

• A fresh look at majority multiplexing when devices get into the picture

  Beiu, V., Ibrahim, W. & Lazarova-Molnar, S., 2007, 2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings. p. 883-888 6 p. 4601325. (2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Multiplexing 100%
  • multiplexing 94%
  • fans 46%
  • Redundancy 20%
  • Defects 16%
  13 Citations (Scopus)

• A Strategy for Reliability Assessment of Future Nano-Circuits

  Lazarova-Molnar, S., Beiu, V. & Ibrahim, W., Jul 28 2007, 11th Conference on Proceedings of the 11th WSEAS International Conference on Circuits.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electronic design automation 100%
  • Networks (circuits) 46%
  • Industry 7%

• Long Live Small Fan-in Majority Gates - Their Reign Looks Like Coming

  Ibrahim, W. & Beiu, V., Jul 8 2007, IEEE International Conference on Application-specific Systems Architectures and Processors.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Adders 100%
  • Cost functions 27%
  • Electric power utilization 22%
  • Networks (circuits) 16%

• On the reliability of four full adder cells

  Ibrahim, W., Beiu, V. & Alkhawwar, Y. A., 2007, Innovations'07: 4th International Conference on Innovations in Information Technology, IIT. IEEE Computer Society, p. 720-724 5 p. 4430508. (Innovations'07: 4th International Conference on Innovations in Information Technology, IIT).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Adders 100%
  • Electric power utilization 11%
  3 Citations (Scopus)

• Proxels for reliability assessment of future nano-architectures

  Lazarova-Molnar, S., Beiu, V. & Ibrahim, W., 2007, Proceedings - IDT'07 The 2nd International Design and Test Workshop. p. 88-89 2 p. 4437435. (Proceedings - IDT'07 The 2nd International Design and Test Workshop).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • circuit reliability 100%
  • evaluation 67%
  • Networks (circuits) 59%
  • occurrences 43%
  • defects 29%

• Reliability the fourth optimization pillar of nanoelectronics

  Lazarova-Molnar, S., Beiu, V. & Ibrahim, W., 2007, ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications. p. 73-76 4 p. 4728258. (ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electronic design automation 84%
  • automation 60%
  • electronics 40%
  • Networks (circuits) 15%
  • indication 12%
  3 Citations (Scopus)

• What von Neumann did not say about multiplexing beyond gate failures - The gory details

  Beiu, V., Ibrahim, W. & Lazarova-Molnar, S., 2007, Computational and Ambient Intelligence - 9th International Work-Conference on Artificial Neural Networks, IWANN 2007, Proceedings. p. 487-496 10 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 4507 LNCS).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Multiplexing 100%
  • Interconnect 24%
  • Reliability Analysis 20%
  • Fan 19%
  • Redundancy 18%
  13 Citations (Scopus)

• Why nano-dsp will be fan-in constrained

  Ibrahim, W., Beiu, V. & Lazarova-Molnar, S., 2007, ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications. p. 317-320 4 p. 4728319. (ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • fan 100%
  • Multiplexing 95%
  • redundancy 55%
  • respect 37%
  • simulation 36%
• 2006

  An adaptive genetic algorithm for VLSI test vector selection

  Ibrahim, W. & Amer, H., Nov 28 2006, Proceedings of the 15th IASTED International Conference on Applied Simulation and Modelling. p. 478-483 6 p. (Proceedings of the 15th IASTED International Conference on Applied Simulation and Modelling; vol. 2006).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Adaptive algorithms 100%
  • Genetic algorithms 70%
  • Tapes 50%
  • System-on-chip 25%
  • Set theory 15%