A bayesian-based EDA tool for nano-circuits reliability calculations

Walid Ibrahim, Valeriu Beiu

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    10 Citations (Scopus)


    As the sizes of (nano-)devices are aggressively scaled deep into the nanometer range, the design and manufacturing of future (nano-)circuits will become extremely complex and inevitably will introduce more defects while their functioning will be adversely affected by transient faults. Therefore, accurately calculating the reliability of future designs will become a very important aspect for (nano-)circuit designers as they investigate several design alternatives to optimize the trade-offs between the conflicting metrics of area-power-energy-delay versus reliability. This paper introduces a novel generic technique for the accurate calculation of the reliability of future nanocircuits. Our aim is to provide both educational and research institutions (as well as the semiconductor industry at a later stage) with an accurate and easy to use tool for closely comparing the reliability of different design alternatives, and for being able to easily select the design that best fits a set of given (design) constraints. Moreover, the reliability model generated by the tool should empower designers with the unique opportunity of understanding the influence individual gates play on the design's overall reliability, and identifying those (few) gates which impact the design's reliability most significantly.

    Original languageEnglish
    Title of host publicationNano-Net - 4th International ICST Conference, Nano-Net 2009, Proceedings
    Number of pages9
    Publication statusPublished - 2009
    Event4th International ICST Conference on Nano-Net, Nano-Net 2009 - Lucerne, Switzerland
    Duration: Oct 18 2009Oct 20 2009

    Publication series

    NameLecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering
    Volume20 LNICST
    ISSN (Print)1867-8211


    Other4th International ICST Conference on Nano-Net, Nano-Net 2009


    • Bayesian networks
    • Eda tools
    • Nano-circuits
    • Reliability

    ASJC Scopus subject areas

    • Computer Networks and Communications


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