A composition-aware model for unreliable circuits

Azam Beg

doi:10.1109/MWSCAS.2010.5548673

A composition-aware model for unreliable circuits

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

As the integrated circuit geometries shrink, it becomes important for the designers to take into consideration the reliability of the circuits. Different techniques can be used for reliability calculation or estimation. Some of the techniques are accurate but time-consuming while others are quick but may not be accurate enough. This work presents a model for calculating reliability (represented by probability of failure) as a function of circuit composition, such as, number of inputs and numbers of different types of gates, etc. The model is based on data collected from the simulations of a large number of combinational circuits.

Original language	English
Title of host publication	2010 IEEE International 53rd Midwest Symposium on Circuits and Systems, MWSCAS 2010
Pages	853-856
Number of pages	4
DOIs	https://doi.org/10.1109/MWSCAS.2010.5548673
Publication status	Published - 2010
Event	53rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2010 - Seattle, WA, United States Duration: Aug 1 2010 → Aug 4 2010

Publication series

Name	Midwest Symposium on Circuits and Systems
ISSN (Print)	1548-3746

Other

Other	53rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2010
Country/Territory	United States
City	Seattle, WA
Period	8/1/10 → 8/4/10

Keywords

Failure probability
Nano-metric circuits
Neural network model
Reliability estimation
Reliability model

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1109/MWSCAS.2010.5548673

Cite this

Beg, A 2010, A composition-aware model for unreliable circuits. in 2010 IEEE International 53rd Midwest Symposium on Circuits and Systems, MWSCAS 2010., 5548673, Midwest Symposium on Circuits and Systems, pp. 853-856, 53rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2010, Seattle, WA, United States, 8/1/10. https://doi.org/10.1109/MWSCAS.2010.5548673

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A composition-aware model for unreliable circuits

Abstract

Publication series

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Keywords

ASJC Scopus subject areas

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