A framework for finding minimal test vectors for stuck-at-faults

Azam Beg; S. K. Hasnain

doi:10.1109/ICICT.2009.5267180

A framework for finding minimal test vectors for stuck-at-faults

Azam Beg, S. K. Hasnain

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper presents a framework that utilizes Boolean Difference theory to find test vectors for stuck-at-fault detection. The framework reads in structural-style Verilog models, and automatically injects single stuck-at-faults (either stuck-at-zero or stuck-at-one) into the models. The simulations are then performed to find minimal sets of test vectors. Using this setup, we conducted experiments on more than 4000 different circuits. The results show that an appreciable savings in test time and effort can be achieved using the method. The same setup can also be used for didactic purposes, specifically for digital design and test courses.

Original language	English
Title of host publication	2009 International Conference on Information and Communication Technologies, ICICT 2009
Pages	259-262
Number of pages	4
DOIs	https://doi.org/10.1109/ICICT.2009.5267180
Publication status	Published - 2009
Event	2009 International Conference on Information and Communication Technologies, ICICT 2009 - Karachi, Pakistan Duration: Aug 15 2009 → Aug 16 2009

Publication series

Name	2009 International Conference on Information and Communication Technologies, ICICT 2009

Other

Other	2009 International Conference on Information and Communication Technologies, ICICT 2009
Country/Territory	Pakistan
City	Karachi
Period	8/15/09 → 8/16/09

ASJC Scopus subject areas

Artificial Intelligence
Computer Networks and Communications
Software

Access to Document

10.1109/ICICT.2009.5267180

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A framework for finding minimal test vectors for stuck-at-faults. / Beg, Azam; Hasnain, S. K.
2009 International Conference on Information and Communication Technologies, ICICT 2009. 2009. p. 259-262 5267180 (2009 International Conference on Information and Communication Technologies, ICICT 2009).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Beg, A & Hasnain, SK 2009, A framework for finding minimal test vectors for stuck-at-faults. in 2009 International Conference on Information and Communication Technologies, ICICT 2009., 5267180, 2009 International Conference on Information and Communication Technologies, ICICT 2009, pp. 259-262, 2009 International Conference on Information and Communication Technologies, ICICT 2009, Karachi, Pakistan, 8/15/09. https://doi.org/10.1109/ICICT.2009.5267180

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A framework for finding minimal test vectors for stuck-at-faults

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