@inproceedings{6a951d73be75406dae4d3af05a5bbf4c,
title = "A fresh look at majority multiplexing when devices get into the picture",
abstract = "In this paper we present the first detailed analysis of von Neumann multiplexing (vN-MUX) using majority (MAJ) gates of small fan-ins Δ (MAJ-Δ) with respect to the probability of failure of the elementary (nano-)devices. Only gates with small fan-ins have been considered, as gates with large fan-ins do not seem practical (at least in the short term) in future technologies. The extensions from an exact counting algorithm (for gate defects and faults only) to device-level failures will allow us to estimate and characterize MAJ-Δ vN-MUX with respect to device-level malfunctions. The reported results depart significantly from all known gate-level analyses-either theoretical or based on simulations. These should be quite important as providing a detailed picture of the behavior of MAJ-Δ vN-MUX when considering the (unreliability of the elementary (nano-)devices (as opposed to gate-level only analyses). The main conclusion is that small fan-in gates (and redundancy schemes relying on such gates) are quite promising-in spite of all previous results at gate-level showing the contrary.",
keywords = "Majority gates, Multiplexing, Nano-architectures, Nano-devices, Reliability",
author = "Valeriu Beiu and Walid Ibrahim and Sanja Lazarova-Molnar",
year = "2007",
doi = "10.1109/NANO.2007.4601325",
language = "English",
isbn = "1424406080",
series = "2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings",
pages = "883--888",
booktitle = "2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings",
note = "2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007 ; Conference date: 02-08-2007 Through 05-08-2007",
}