TY - GEN
T1 - A high-speed THz permittivity measurement system featuring a simple 2-tone generation method using LO leakage
AU - Jyo, Teruo
AU - Hamada, Hiroshi
AU - Kitayama, Daisuke
AU - Yaita, Makoto
AU - Moutaouakil, Amine El
AU - Matsuzaki, Hideaki
AU - Nosaka, Hideyuki
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/10/4
Y1 - 2017/10/4
N2 - A fast and simple permittivity measurement system at the terahertz wave band is proposed. A 2-tone method is used to measure permittivity. To generate the 2-tone signal simply, a method using just a single frequency oscillator and LO leakage at the transmitter is proposed. For fast measurement of the two-tone phase difference, a self-heterodyne technique with a simple diode is applied in the receiver. The proposed system achieved a measurement time of 0.03 ms at one point, which is 1/200 compared to a conventional system, with an error of less than 6%.
AB - A fast and simple permittivity measurement system at the terahertz wave band is proposed. A 2-tone method is used to measure permittivity. To generate the 2-tone signal simply, a method using just a single frequency oscillator and LO leakage at the transmitter is proposed. For fast measurement of the two-tone phase difference, a self-heterodyne technique with a simple diode is applied in the receiver. The proposed system achieved a measurement time of 0.03 ms at one point, which is 1/200 compared to a conventional system, with an error of less than 6%.
KW - 2-tone CW
KW - High-speed measurement
KW - Nondestructive inspection
KW - Permittivity measurement
KW - Phase slope
KW - Self-heterodyne
KW - Terahertz
KW - Thickness measurement
UR - http://www.scopus.com/inward/record.url?scp=85032491683&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85032491683&partnerID=8YFLogxK
U2 - 10.1109/MWSYM.2017.8058918
DO - 10.1109/MWSYM.2017.8058918
M3 - Conference contribution
AN - SCOPUS:85032491683
T3 - IEEE MTT-S International Microwave Symposium Digest
SP - 1527
EP - 1530
BT - 2017 IEEE MTT-S International Microwave Symposium, IMS 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 IEEE MTT-S International Microwave Symposium, IMS 2017
Y2 - 4 June 2017 through 9 June 2017
ER -