A low-complexity MMSE Bayesian estimator for suppression of speckle in SAR images

Rafat R. Damseh, M. Omair Ahmad

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In synthetic aperture radar (SAR) images, speckle noise reduction is a crucial pre-processing step for their successful interpretation and thus has drawn a great deal of attention of researchers in the image processing community. The Bayesian estimation is a powerful signal estimation technique and has been widely used for speckle noise removal in images. In this work, a low complexity wavelet-based Bayesian estimation technique for despeckling of images is developed. The main idea of the proposed technique is in establishing suitable statistical models for the wavelet coefficients and then in using these models to develop a shrinkage function with a low-complexity realization for the estimation of the wavelet coefficients of the noise-free images. The experimental results demonstrate the effectiveness of the proposed despeckling scheme in providing a significant reduction in the speckle noise at a very low computational cost and simultaneously preserving the image details.

Original languageEnglish
Title of host publicationISCAS 2016 - IEEE International Symposium on Circuits and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1002-1005
Number of pages4
ISBN (Electronic)9781479953400
DOIs
Publication statusPublished - Jul 29 2016
Externally publishedYes
Event2016 IEEE International Symposium on Circuits and Systems, ISCAS 2016 - Montreal, Canada
Duration: May 22 2016May 25 2016

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume2016-July
ISSN (Print)0271-4310

Other

Other2016 IEEE International Symposium on Circuits and Systems, ISCAS 2016
Country/TerritoryCanada
CityMontreal
Period5/22/165/25/16

Keywords

  • image despeckling
  • MMSE Bayesian estimation
  • statistical model of image wavelet coefficients
  • Synthetic aperture radar (SAR) image
  • wavelet shrinkage

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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