A Lumped Element Analog of Dual-Stub Microwave Electromagnetically Induced Transparency Resonator

Abdul Jabber, Omar Siddiqui, Farooq A. Tahir, Muhammad Amin, Muhammad Rashad Ramzan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper presents lumped element manifestation of the quantum phenomenon known as Electromagnetically Induced Transparency (EIT). The EIT effect is reproduced at microwave frequencies by exploiting the interference effects of two series-RLC resonators that load a microstrip line in shunt configuration. The compact EIT-based devices can be employed in various microwave applications such as tunable filtering, phase shifting and material sensing. The proposed design provides the quality factor of 22, insertion loss of less than 1. SdB and 3dB bandwidth of 43 MHz.

Original languageEnglish
Title of host publication2018 18th Mediterranean Microwave Symposium, MMS 2018
PublisherIEEE Computer Society
Pages168-170
Number of pages3
ISBN (Electronic)9781538671320
DOIs
Publication statusPublished - Jan 14 2019
Externally publishedYes
Event18th Mediterranean Microwave Symposium, MMS 2018 - Istanbul, Turkey
Duration: Oct 31 2018Nov 2 2018

Publication series

NameMediterranean Microwave Symposium
Volume2018-October
ISSN (Print)2157-9822
ISSN (Electronic)2157-9830

Conference

Conference18th Mediterranean Microwave Symposium, MMS 2018
Country/TerritoryTurkey
CityIstanbul
Period10/31/1811/2/18

Keywords

  • electromagnetically induced transparency
  • Fano resonance
  • open stub resonator
  • resonance
  • series RLC resonators

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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