A mathematical model for the analysis of the johnson-nyquist thermal noise on the reliability in nano-communications

Pietro Santagati, Valeriu Beiu

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    The aim of this paper is to investigate how the length of communication links could affect the reliability during operations, by analysing how the Johnson-Nyquist (thermal) noise on the links affects the probability of failure (defined as the probability of switching) of devices/switches scaled to the limit like, e. g., ion channels but also nanoscale CMOS transistors. To this end, we will consider classical CMOS circuits, and base our analysis on statistical considerations. In particular, our aim is to look for the existence of an optimum wire/link length in this context, which would maximize the reliability of the simplest system formed by a communication link (wire) driving a switch (transistor or ion channel).

    Original languageEnglish
    Title of host publicationBio-Inspired Models of Network, Information and Computing Systems - 7th International ICST Conference, BIONETICS 2012, Revised Selected Papers
    EditorsGuy Theraulaz, Gianni A. di Caro
    PublisherSpringer Verlag
    Pages49-59
    Number of pages11
    ISBN (Print)9783319069432
    DOIs
    Publication statusPublished - 2014
    Event7th International ICST Conference on Bio-Inspired Models of Network, Information, and Computing Systems, BIONETICS 2012 - Lugano, Switzerland
    Duration: Dec 10 2012Dec 11 2012

    Publication series

    NameLecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering, LNICST
    Volume134
    ISSN (Print)1867-8211

    Other

    Other7th International ICST Conference on Bio-Inspired Models of Network, Information, and Computing Systems, BIONETICS 2012
    Country/TerritorySwitzerland
    CityLugano
    Period12/10/1212/11/12

    ASJC Scopus subject areas

    • Computer Networks and Communications

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