TY - GEN
T1 - A new look at classification of transformer normal and abnormal currents
AU - Abdel-Hafez, Mohamed
AU - Gaouda, Ahmed M.
PY - 2010
Y1 - 2010
N2 - The paper proposes an enhanced wavelet-based feature extraction technique to classify transformer inrush currents (TIC) and transformer internal faults (TIF). The proposed tool utilizes the number of wavelet coefficients of local maxima as current signal slides into Kaiser's window. The general pattern of number of coefficients of local maxima at the first three resolutions are used to design a new automated tool for monitoring and classifying abnormal conditions in power transformers. The proposed monitoring technique is evaluated using large data sets.
AB - The paper proposes an enhanced wavelet-based feature extraction technique to classify transformer inrush currents (TIC) and transformer internal faults (TIF). The proposed tool utilizes the number of wavelet coefficients of local maxima as current signal slides into Kaiser's window. The general pattern of number of coefficients of local maxima at the first three resolutions are used to design a new automated tool for monitoring and classifying abnormal conditions in power transformers. The proposed monitoring technique is evaluated using large data sets.
KW - Inrush current
KW - Kaiser's window
KW - Multi-resolution analysis
KW - Transformer faults
KW - Wavelet transform
UR - http://www.scopus.com/inward/record.url?scp=77954272456&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77954272456&partnerID=8YFLogxK
U2 - 10.1109/MELCON.2010.5475955
DO - 10.1109/MELCON.2010.5475955
M3 - Conference contribution
AN - SCOPUS:77954272456
SN - 9781424457953
T3 - Proceedings of the Mediterranean Electrotechnical Conference - MELECON
SP - 830
EP - 834
BT - MELECON 2010 - The 15th IEEE Mediterranean Electrotechnical Conference
T2 - 15th IEEE Mediterranean Electrotechnical Conference, MELECON 2010
Y2 - 25 April 2010 through 28 April 2010
ER -