A Strategy for Reliability Assessment of Future Nano-Circuits

Sanja Lazarova-Molnar, Valeriu Beiu, Walid Ibrahim

Research output: Chapter in Book/Report/Conference proceedingConference contribution


This paper summarizes a strategy for development of an EDA (Electronic Design Automation) tool which is aimed to support the design of future nano-circuits. The problem with the existing EDA tools is that they do not explicitly consider reliability as a design criterion. Most of the tools that do consider reliability are not intended for the nanoelectronic industry and are very limited in the types of failure models they can assess. Moreover, current indications show that moving towards nano-scale will significantly increase the failure rates. It follows that an improved EDA tool which would efficiently assess reliability (besides speed, power, area, etc.) is becoming a necessity. In this paper we detail a strategy and its methods that could ultimately lead to an EDA tool for realistic reliability evaluation of nano-circuits.
Original languageEnglish
Title of host publication11th Conference on Proceedings of the 11th WSEAS International Conference on Circuits
Publication statusPublished - Jul 28 2007
EventICC'07 - Agios Nikolaos, Crete Island, Greece
Duration: Jul 28 2007 → …


Period7/28/07 → …


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