A topographic correction for VLF-EM profiles based on model studies

H. A. Baker, J. O. Myers

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

The VLF-EM model apparatus already described by the authors (Baker and Myers, 1979) has been developed to provide a topographic correction which can be applied to field profiles of the real component. The results from which the method is derived are given and the application is demonstrated on field results obtained in hilly terrain.

Original languageEnglish
Pages (from-to)135-144
Number of pages10
JournalGeoexploration
Volume18
Issue number2
DOIs
Publication statusPublished - Apr 1980
Externally publishedYes

ASJC Scopus subject areas

  • General Engineering

Fingerprint

Dive into the research topics of 'A topographic correction for VLF-EM profiles based on model studies'. Together they form a unique fingerprint.

Cite this