TY - GEN
T1 - A two-phase genetic algorithm for VLSI test vector selection
AU - Ibrahim, Walid
AU - Elchouemi, Amr
AU - Amer, Hoda
PY - 2006
Y1 - 2006
N2 - Design validation is one of the most complicated and costly tasks in today's system-on-chip development process. Conditions to be validated are identified by the architects, the designers, and the validation team. Testing for these conditions is a must for the design to tape out especially for high priority conditions. A significant bottleneck in such systems is that not enough time is normally given to the final coverage phase which makes computing cycles very precious. Thus, intelligent selection of test vectors that achieve the target coverage using the minimum number of computing cycles is crucial for on time tape out. This paper presents a two-phase genetic algorithm for test vector selection and condition coverage. The proposed algorithm significantly outperforms other proposed heuristic algorithms in different scenarios, while taking into considerations the conditions priorities and computing cycles required by each test vector.
AB - Design validation is one of the most complicated and costly tasks in today's system-on-chip development process. Conditions to be validated are identified by the architects, the designers, and the validation team. Testing for these conditions is a must for the design to tape out especially for high priority conditions. A significant bottleneck in such systems is that not enough time is normally given to the final coverage phase which makes computing cycles very precious. Thus, intelligent selection of test vectors that achieve the target coverage using the minimum number of computing cycles is crucial for on time tape out. This paper presents a two-phase genetic algorithm for test vector selection and condition coverage. The proposed algorithm significantly outperforms other proposed heuristic algorithms in different scenarios, while taking into considerations the conditions priorities and computing cycles required by each test vector.
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U2 - 10.1109/cec.2006.1688404
DO - 10.1109/cec.2006.1688404
M3 - Conference contribution
AN - SCOPUS:34547287051
SN - 0780394879
SN - 9780780394872
T3 - 2006 IEEE Congress on Evolutionary Computation, CEC 2006
SP - 878
EP - 884
BT - 2006 IEEE Congress on Evolutionary Computation, CEC 2006
PB - IEEE Computer Society
T2 - 2006 IEEE Congress on Evolutionary Computation, CEC 2006
Y2 - 16 July 2006 through 21 July 2006
ER -