TY - GEN
T1 - Accurate nano-circuits reliability evaluations based on combining numerical simulations with Monte Carlo
AU - Ibrahim, Walid
AU - Beiu, Valeriu
AU - Lazarova-Molnar, Sanja
PY - 2007
Y1 - 2007
N2 - This paper proposes a new approach to accurately evaluate the reliability of future nano-circuits. The proposed approach combines the accuracy and intuitiveness of Monte Carlo (MC) simulation with the simplicity and high modeling capacity of numerical simulations. This approach is important and timely as the expected size of future nano-circuits will make the exclusive usage of MC simulation timely prohibitive. At the same time, simulation methods that depend solely on numerical simulations are unfortunately not accurate enough. Experimental results show that the circuit reliability calculated by the proposed approach is very close to the reliability calculated based on MC simulation only. Index Terms - Reliability evaluation, nano-circuits, Monte Carlo, Bayesian networks, numerical methods.
AB - This paper proposes a new approach to accurately evaluate the reliability of future nano-circuits. The proposed approach combines the accuracy and intuitiveness of Monte Carlo (MC) simulation with the simplicity and high modeling capacity of numerical simulations. This approach is important and timely as the expected size of future nano-circuits will make the exclusive usage of MC simulation timely prohibitive. At the same time, simulation methods that depend solely on numerical simulations are unfortunately not accurate enough. Experimental results show that the circuit reliability calculated by the proposed approach is very close to the reliability calculated based on MC simulation only. Index Terms - Reliability evaluation, nano-circuits, Monte Carlo, Bayesian networks, numerical methods.
KW - Bayesian networks
KW - Monte Carlo
KW - Nano-circuits
KW - Numerical methods
KW - Reliability evaluation
UR - http://www.scopus.com/inward/record.url?scp=44949179780&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=44949179780&partnerID=8YFLogxK
U2 - 10.1109/IDT.2007.4437447
DO - 10.1109/IDT.2007.4437447
M3 - Conference contribution
AN - SCOPUS:44949179780
SN - 9781424418251
T3 - Proceedings - IDT'07 The 2nd International Design and Test Workshop
SP - 139
EP - 144
BT - Proceedings - IDT'07 The 2nd International Design and Test Workshop
T2 - 2nd international Design and Test Workshop, IDT 2007
Y2 - 16 December 2007 through 18 December 2007
ER -