Accurate nano-circuits reliability evaluations based on combining numerical simulations with Monte Carlo

Walid Ibrahim, Valeriu Beiu, Sanja Lazarova-Molnar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper proposes a new approach to accurately evaluate the reliability of future nano-circuits. The proposed approach combines the accuracy and intuitiveness of Monte Carlo (MC) simulation with the simplicity and high modeling capacity of numerical simulations. This approach is important and timely as the expected size of future nano-circuits will make the exclusive usage of MC simulation timely prohibitive. At the same time, simulation methods that depend solely on numerical simulations are unfortunately not accurate enough. Experimental results show that the circuit reliability calculated by the proposed approach is very close to the reliability calculated based on MC simulation only. Index Terms - Reliability evaluation, nano-circuits, Monte Carlo, Bayesian networks, numerical methods.

Original languageEnglish
Title of host publicationProceedings - IDT'07 The 2nd International Design and Test Workshop
Pages139-144
Number of pages6
DOIs
Publication statusPublished - 2007
Event2nd international Design and Test Workshop, IDT 2007 - Cairo, Egypt
Duration: Dec 16 2007Dec 18 2007

Publication series

NameProceedings - IDT'07 The 2nd International Design and Test Workshop

Other

Other2nd international Design and Test Workshop, IDT 2007
Country/TerritoryEgypt
CityCairo
Period12/16/0712/18/07

Keywords

  • Bayesian networks
  • Monte Carlo
  • Nano-circuits
  • Numerical methods
  • Reliability evaluation

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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