All-terminal network reliability optimization in fading environment via cross entropy method

Shawqi Kharbash, Wenye Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

This paper presents a new algorithm that can be readily applied to solve all-terminal network reliability optimization problem of a wireless network in a fading environment. The optimization problem solved considers finding the optimal topological layout of links at which the all-terminal network reliability is maximized by controlling the nodes' transmission powers. To that end, a link probabilistic model is developed to relate fading, attenuation, interference and nodes' transmission powers to link reliability. Then, the proposed algorithm utilized this probabilistic model to control nodes' transmission power to maximize links reliabilities and hence all-terminal network reliability. The proposed algorithm is based on two major steps that use a global stochastic optimization technique, Cross Entropy (CE) to generate the optimal network topology and control nodes transmission powers such that all-terminal network reliability is maximized. An illustrative example is used to illustrate the proposed algorithm.

Original languageEnglish
Title of host publication2010 IEEE International Conference on Communications, ICC 2010
DOIs
Publication statusPublished - 2010
Externally publishedYes
Event2010 IEEE International Conference on Communications, ICC 2010 - Cape Town, South Africa
Duration: May 23 2010May 27 2010

Publication series

NameIEEE International Conference on Communications
ISSN (Print)0536-1486

Other

Other2010 IEEE International Conference on Communications, ICC 2010
Country/TerritorySouth Africa
CityCape Town
Period5/23/105/27/10

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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