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An adaptive heuristic algorithm for VLSI test vectors selection
Walid Ibrahim
, Hesham El-Sayed
, Amr El-Chouemie
,
Hoda Amer
Department of Computer Science and Software Engineering
Research output
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peer-review
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Keyphrases
Adaptive Heuristic Algorithm
100%
Vector Selection
100%
Test Vector
100%
VLSI Testing
100%
Verification Process
66%
Increasing Complexity
33%
Design Verification
33%
System Architect
33%
Minimum number
33%
On-a-chip
33%
Intelligent Selection
33%
Verification Plan
33%
Heuristic Algorithms
33%
Chip Design
33%
Computer Science
Verification Process
100%
Heuristic Algorithm
100%
Individual Core
50%
System Architect
50%
Verification Plan
50%
System on a Chip
50%
Design Verification
50%
Engineering
Tape
100%
Design Verification
50%