Atomic-norm for joint data recovery and narrow-band interference mitigation in OFDM systems

Hanan Al-Tous, Imad Barhumi, Naofal Al-Dhahir

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

In this paper, a novel approach is proposed to jointly recover the transmitted signal and mitigate narrow-band interference (NBI) in OFDM systems using a compressive sensing (CS) framework. NBI degrades the performance of OFDM systems which motivates the need for mitigation techniques to reduce its effect. The main idea behind our approach is to represent the transmitted data and the NBI signal as sparse atoms and then to solve a joint compressive sensing (JCS) problem. The recovery problem is formulated as a weighted optimization problem of two atomic norms and then solved using convex programming. The solution aims to recover the transmitted signal and NBI jointly. The off-grid problem of NBI signal is avoided using the atomic norm. The bit error rate (BER) performance of our proposed JCS recovery approach outperforms the BER performance of the conventional CS-based approach as demonstrated by simulation results.

Original languageEnglish
Title of host publication2016 IEEE 27th Annual International Symposium on Personal, Indoor, and Mobile Radio Communications, PIMRC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509032549
DOIs
Publication statusPublished - Dec 21 2016
Event27th IEEE Annual International Symposium on Personal, Indoor, and Mobile Radio Communications, PIMRC 2016 - Valencia, Spain
Duration: Sept 4 2016Sept 8 2016

Publication series

NameIEEE International Symposium on Personal, Indoor and Mobile Radio Communications, PIMRC

Other

Other27th IEEE Annual International Symposium on Personal, Indoor, and Mobile Radio Communications, PIMRC 2016
Country/TerritorySpain
CityValencia
Period9/4/169/8/16

Keywords

  • NBI
  • OFDM
  • atomic norm
  • compressive sensing
  • semi-definite programming

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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