TY - GEN
T1 - Automatic generation of characterization circuits - An application in academia
AU - Beg, Azam
PY - 2013/12/1
Y1 - 2013/12/1
N2 - Circuit characterization is an essential topic in most integrated circuit design courses in an electronic and/or computer engineering curricula. In such courses, a standard set of basic circuits (called standard cells) needs to be characterized based on different design criteria, for example, noise margin, power, performance, etc. So the students usually need to go through the manual, iterative process of creation of circuit descriptions (defined by Spice netlists) - a process that is not only time-consuming but also prone to errors. For the students to be able to conduct a large number of experiments while focusing on the design issues rather than on the tedious task of creating different circuit variants, an online tool is being proposed. The tool can be used in different courses that cover the topics of nano-sized CMOS (complementary metal oxide semiconductor) digital design, VLSI (very large scale integrated) circuit design, low-power digital circuit design, circuit reliability, etc.
AB - Circuit characterization is an essential topic in most integrated circuit design courses in an electronic and/or computer engineering curricula. In such courses, a standard set of basic circuits (called standard cells) needs to be characterized based on different design criteria, for example, noise margin, power, performance, etc. So the students usually need to go through the manual, iterative process of creation of circuit descriptions (defined by Spice netlists) - a process that is not only time-consuming but also prone to errors. For the students to be able to conduct a large number of experiments while focusing on the design issues rather than on the tedious task of creating different circuit variants, an online tool is being proposed. The tool can be used in different courses that cover the topics of nano-sized CMOS (complementary metal oxide semiconductor) digital design, VLSI (very large scale integrated) circuit design, low-power digital circuit design, circuit reliability, etc.
KW - Cell characterization
KW - Circuit reliability
KW - Digital CMOS circuit
KW - Low-power design
KW - Online circuit generation
KW - Spice simulation
KW - Standard cell
KW - Testbench
KW - VLSI design
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U2 - 10.1109/FIE.2013.6684909
DO - 10.1109/FIE.2013.6684909
M3 - Conference contribution
AN - SCOPUS:84893324987
SN - 9781467352611
T3 - Proceedings - Frontiers in Education Conference, FIE
SP - 661
EP - 664
BT - 2013 Frontiers in Education Conference
T2 - 43rd IEEE Annual Frontiers in Education Conference, FIE 2013
Y2 - 23 October 2013 through 26 October 2013
ER -