Bayesian inference for partially accelerated life tests using Gibbs sampling

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    14 Citations (Scopus)


    We consider a life testing situation in which several groups of items are put, at different instances, on the partially accelerated life test proposed by DeGroot and Goel [Naval Research Logistics Quarterly, 1979. 26, 223-235], The combined failure time data are then used to derive empirical Bayes estimators for the failure of the exponential life length under normal conditions. The estimation which is implemented using the Gibbs sampler Monte-Carlo-based approach, illustrates once again the ease with which these new types of estimation problems often requiring sophisticated numerical or analytical expertise, can be handled using the sampling based approach.

    Original languageEnglish
    Pages (from-to)1165-1168
    Number of pages4
    JournalMicroelectronics Reliability
    Issue number8
    Publication statusPublished - Aug 1997

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Safety, Risk, Reliability and Quality
    • Condensed Matter Physics
    • Surfaces, Coatings and Films
    • Electrical and Electronic Engineering


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