TY - GEN
T1 - Boosting ser test for RF transceivers by simple DSP technique
AU - Da̧browski, Jerzy
AU - Ramzan, Rashad
PY - 2007
Y1 - 2007
N2 - The paper presents a new technique of symbol error rate test (SER) for RF transceivers. A simple DSP algorithm implemented at the receiver baseband is introduced in terms of constellation correction, which is usually used to compensate for IQ imbalance. The test is oriented at detection of impairments in gain and noise figure in a transceiver frontend. The proposed approach is shown to enhance the sensitivity of a traditional SER test to the limits of its counterpart, the error vector magnitude (EVM) test. Its advantage over EVM is in simple implementation, lower DSP overhead and the ability of achieving a larger dynamic range of the test response. Also the test time is saved compared to a traditional SER test. The technique is validated by a simulation model of a Wi-Fi transceiver implemented in Matlab ™.
AB - The paper presents a new technique of symbol error rate test (SER) for RF transceivers. A simple DSP algorithm implemented at the receiver baseband is introduced in terms of constellation correction, which is usually used to compensate for IQ imbalance. The test is oriented at detection of impairments in gain and noise figure in a transceiver frontend. The proposed approach is shown to enhance the sensitivity of a traditional SER test to the limits of its counterpart, the error vector magnitude (EVM) test. Its advantage over EVM is in simple implementation, lower DSP overhead and the ability of achieving a larger dynamic range of the test response. Also the test time is saved compared to a traditional SER test. The technique is validated by a simulation model of a Wi-Fi transceiver implemented in Matlab ™.
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U2 - 10.1109/DATE.2007.364680
DO - 10.1109/DATE.2007.364680
M3 - Conference contribution
AN - SCOPUS:34548303619
SN - 3981080122
SN - 9783981080124
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 719
EP - 724
BT - Proceedings - 2007 Design, Automation and Test in Europe Conference and Exhibition, DATE 2007
T2 - 2007 Design, Automation and Test in Europe Conference and Exhibition
Y2 - 16 April 2007 through 20 April 2007
ER -