Deep metric learning for person re-identification

Dong Yi, Zhen Lei, Shengcai Liao, Stan Z. Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

928 Citations (Scopus)

Abstract

Various hand-crafted features and metric learning methods prevail in the field of person re-identification. Compared to these methods, this paper proposes a more general way that can learn a similarity metric from image pixels directly. By using a 'siamese' deep neural network, the proposed method can jointly learn the color feature, texture feature and metric in a unified framework. The network has a symmetry structure with two sub-networks which are connected by a cosine layer. Each sub network includes two convolutional layers and a full connected layer. To deal with the big variations of person images, binomial deviance is used to evaluate the cost between similarities and labels, which is proved to be robust to outliers. Experiments on VIPeR illustrate the superior performance of our method and a cross database experiment also shows its good generalization.

Original languageEnglish
Title of host publicationProceedings - International Conference on Pattern Recognition
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages34-39
Number of pages6
ISBN (Electronic)9781479952083
DOIs
Publication statusPublished - Dec 4 2014
Externally publishedYes
Event22nd International Conference on Pattern Recognition, ICPR 2014 - Stockholm, Sweden
Duration: Aug 24 2014Aug 28 2014

Publication series

NameProceedings - International Conference on Pattern Recognition
ISSN (Print)1051-4651

Conference

Conference22nd International Conference on Pattern Recognition, ICPR 2014
Country/TerritorySweden
CityStockholm
Period8/24/148/28/14

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition

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