TY - GEN
T1 - Deep metric learning for person re-identification
AU - Yi, Dong
AU - Lei, Zhen
AU - Liao, Shengcai
AU - Li, Stan Z.
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/12/4
Y1 - 2014/12/4
N2 - Various hand-crafted features and metric learning methods prevail in the field of person re-identification. Compared to these methods, this paper proposes a more general way that can learn a similarity metric from image pixels directly. By using a 'siamese' deep neural network, the proposed method can jointly learn the color feature, texture feature and metric in a unified framework. The network has a symmetry structure with two sub-networks which are connected by a cosine layer. Each sub network includes two convolutional layers and a full connected layer. To deal with the big variations of person images, binomial deviance is used to evaluate the cost between similarities and labels, which is proved to be robust to outliers. Experiments on VIPeR illustrate the superior performance of our method and a cross database experiment also shows its good generalization.
AB - Various hand-crafted features and metric learning methods prevail in the field of person re-identification. Compared to these methods, this paper proposes a more general way that can learn a similarity metric from image pixels directly. By using a 'siamese' deep neural network, the proposed method can jointly learn the color feature, texture feature and metric in a unified framework. The network has a symmetry structure with two sub-networks which are connected by a cosine layer. Each sub network includes two convolutional layers and a full connected layer. To deal with the big variations of person images, binomial deviance is used to evaluate the cost between similarities and labels, which is proved to be robust to outliers. Experiments on VIPeR illustrate the superior performance of our method and a cross database experiment also shows its good generalization.
UR - http://www.scopus.com/inward/record.url?scp=84919930491&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84919930491&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2014.16
DO - 10.1109/ICPR.2014.16
M3 - Conference contribution
AN - SCOPUS:84919930491
T3 - Proceedings - International Conference on Pattern Recognition
SP - 34
EP - 39
BT - Proceedings - International Conference on Pattern Recognition
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 22nd International Conference on Pattern Recognition, ICPR 2014
Y2 - 24 August 2014 through 28 August 2014
ER -