Design and analysis of SET circuits: Using MATLAB modules and SIMON

Mawahib Sulieman; Valeriu Beiu

Design and analysis of SET circuits: Using MATLAB modules and SIMON

Mawahib Sulieman, Valeriu Beiu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper describes two MATLAB modules which have been developed for enhancing SIMON, a Monte Carlo simulator for single electron technology (SET) circuits. The first module facilitates the hierarchical design of larger SET circuits, and has: (i) a sub-module that builds a larger circuit - starting from a library of gates; while (ii) another sub-module allows for an easier specification of the input signals. The second module allows for the statistical analysis of SET circuits. The usefulness of the two modules has already been established through: (i) the design, simulation, and characterization of an advanced 16-bit capacitive SET threshold logic adder; (ii) the comparison of many different SET full adders; (iii) an analysis of the sensitivity to variations of different SET gates; and (iv) an analysis of a novel fault-tolerant architecture based on multiplexing.

Original language	English
Title of host publication	2004 4th IEEE Conference on Nanotechnology
Pages	618-621
Number of pages	4
Publication status	Published - 2004
Externally published	Yes
Event	2004 4th IEEE Conference on Nanotechnology - Munich, Germany Duration: Aug 16 2004 → Aug 19 2004

Publication series

Name	2004 4th IEEE Conference on Nanotechnology

Other

Other	2004 4th IEEE Conference on Nanotechnology
Country/Territory	Germany
City	Munich
Period	8/16/04 → 8/19/04

Keywords

Fault-tolerance
MATLAB
SIMON
Simulation software
Single electron technology
Variations

ASJC Scopus subject areas

General Engineering

Cite this

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title = "Design and analysis of SET circuits: Using MATLAB modules and SIMON",

abstract = "This paper describes two MATLAB modules which have been developed for enhancing SIMON, a Monte Carlo simulator for single electron technology (SET) circuits. The first module facilitates the hierarchical design of larger SET circuits, and has: (i) a sub-module that builds a larger circuit - starting from a library of gates; while (ii) another sub-module allows for an easier specification of the input signals. The second module allows for the statistical analysis of SET circuits. The usefulness of the two modules has already been established through: (i) the design, simulation, and characterization of an advanced 16-bit capacitive SET threshold logic adder; (ii) the comparison of many different SET full adders; (iii) an analysis of the sensitivity to variations of different SET gates; and (iv) an analysis of a novel fault-tolerant architecture based on multiplexing.",

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author = "Mawahib Sulieman and Valeriu Beiu",

year = "2004",

language = "English",

isbn = "0780385365",

series = "2004 4th IEEE Conference on Nanotechnology",

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note = "2004 4th IEEE Conference on Nanotechnology ; Conference date: 16-08-2004 Through 19-08-2004",

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AU - Sulieman, Mawahib

AU - Beiu, Valeriu

PY - 2004

Y1 - 2004

N2 - This paper describes two MATLAB modules which have been developed for enhancing SIMON, a Monte Carlo simulator for single electron technology (SET) circuits. The first module facilitates the hierarchical design of larger SET circuits, and has: (i) a sub-module that builds a larger circuit - starting from a library of gates; while (ii) another sub-module allows for an easier specification of the input signals. The second module allows for the statistical analysis of SET circuits. The usefulness of the two modules has already been established through: (i) the design, simulation, and characterization of an advanced 16-bit capacitive SET threshold logic adder; (ii) the comparison of many different SET full adders; (iii) an analysis of the sensitivity to variations of different SET gates; and (iv) an analysis of a novel fault-tolerant architecture based on multiplexing.

AB - This paper describes two MATLAB modules which have been developed for enhancing SIMON, a Monte Carlo simulator for single electron technology (SET) circuits. The first module facilitates the hierarchical design of larger SET circuits, and has: (i) a sub-module that builds a larger circuit - starting from a library of gates; while (ii) another sub-module allows for an easier specification of the input signals. The second module allows for the statistical analysis of SET circuits. The usefulness of the two modules has already been established through: (i) the design, simulation, and characterization of an advanced 16-bit capacitive SET threshold logic adder; (ii) the comparison of many different SET full adders; (iii) an analysis of the sensitivity to variations of different SET gates; and (iv) an analysis of a novel fault-tolerant architecture based on multiplexing.

KW - Fault-tolerance

KW - MATLAB

KW - SIMON

KW - Simulation software

KW - Single electron technology

KW - Variations

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M3 - Conference contribution

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BT - 2004 4th IEEE Conference on Nanotechnology

Y2 - 16 August 2004 through 19 August 2004

ER -

Design and analysis of SET circuits: Using MATLAB modules and SIMON

Abstract

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Keywords

ASJC Scopus subject areas

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