Design and analysis of SET circuits: Using MATLAB modules and SIMON

Mawahib Sulieman, Valeriu Beiu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

25 Citations (Scopus)


This paper describes two MATLAB modules which have been developed for enhancing SIMON, a Monte Carlo simulator for single electron technology (SET) circuits. The first module facilitates the hierarchical design of larger SET circuits, and has: (i) a sub-module that builds a larger circuit - starting from a library of gates; while (ii) another sub-module allows for an easier specification of the input signals. The second module allows for the statistical analysis of SET circuits. The usefulness of the two modules has already been established through: (i) the design, simulation, and characterization of an advanced 16-bit capacitive SET threshold logic adder; (ii) the comparison of many different SET full adders; (iii) an analysis of the sensitivity to variations of different SET gates; and (iv) an analysis of a novel fault-tolerant architecture based on multiplexing.

Original languageEnglish
Title of host publication2004 4th IEEE Conference on Nanotechnology
Number of pages4
Publication statusPublished - 2004
Externally publishedYes
Event2004 4th IEEE Conference on Nanotechnology - Munich, Germany
Duration: Aug 16 2004Aug 19 2004

Publication series

Name2004 4th IEEE Conference on Nanotechnology


Other2004 4th IEEE Conference on Nanotechnology


  • Fault-tolerance
  • Simulation software
  • Single electron technology
  • Variations

ASJC Scopus subject areas

  • General Engineering


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