TY - GEN
T1 - Design optimisation through mapping for high value components
T2 - DETC2005: ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
AU - Srikumaran, S.
AU - Sivaloganathan, S.
PY - 2005/12/1
Y1 - 2005/12/1
N2 - In high value added component machining, achieving the required quality and cost is ensured by performing all machining quality critical operations in a single setting-up. It is paramount for the design to be checked for its manufacturability with the available manufacturing resources, tooling operations and quality critical machining carried out with minimum number of setting. The hypothesis of this paper is that a higher level mapping between the designs and manufacturing features of the component in question at design stage can pave the way for ensuring that the above requirement is met. This paper establishes the need for such a mapping and details the requirement and specifications of such a mapping.
AB - In high value added component machining, achieving the required quality and cost is ensured by performing all machining quality critical operations in a single setting-up. It is paramount for the design to be checked for its manufacturability with the available manufacturing resources, tooling operations and quality critical machining carried out with minimum number of setting. The hypothesis of this paper is that a higher level mapping between the designs and manufacturing features of the component in question at design stage can pave the way for ensuring that the above requirement is met. This paper establishes the need for such a mapping and details the requirement and specifications of such a mapping.
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M3 - Conference contribution
AN - SCOPUS:33244495119
SN - 0791847411
SN - 9780791847411
T3 - Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference - DETC2005
SP - 551
EP - 556
BT - Proc. of the ASME International Des. Eng. Tech. Conferences and Computers and Inf. in Engineering Conf. - DETC2005
Y2 - 24 September 2005 through 28 September 2005
ER -