Abstract
Transient photocurrent (TPC) measurements have been carried out on evaporated a-Se doped with either 0.2% or 0.5% of As and compared with analogous measurements on undoped and Cl doped a-Se. These measurements show that As doping of a-Se suppresses the shallow defects linked to the dihedral angle variations in a-Se chains, and makes the valence band tail states distribution steeper. These changes in the a-Se density of states increase the relative importance of the deep defect levels in As-doped a-Se and thus explain the widely reported hole lifetime shortening with As addition.
Original language | English |
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Pages (from-to) | 877-880 |
Number of pages | 4 |
Journal | Physica Status Solidi (C) Current Topics in Solid State Physics |
Volume | 7 |
Issue number | 3-4 |
DOIs | |
Publication status | Published - 2010 |
Event | 23rd International Conference on Amorphous and Nanocrystalline Semiconductors, ICANS23 - Utrecht, Netherlands Duration: Aug 23 2009 → Aug 28 2009 |
ASJC Scopus subject areas
- Condensed Matter Physics