Effect of relaxation time on dis-continuous passivation film

H. Nanjo, K. Sajiki, N. Hoshi, F. M.B. Hassan, S. Venkatachalam, M. Kanakubo, T. Aida, Y. Suzuki, J. Onagawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The cycle of short time passivation and the following weak reduction was repeated and oxidation film of a few atomic layers were formed and relaxed for a designed time at each cycle. In other wards, passive film was generated by dis-continuous passivation method such as layer-by-layer fabrication in a sub-nanometer scale. Then atomically flat surface was fabricated on the dis-continuous passivation film.

Original languageEnglish
Title of host publicationNanotechnology (General) - 216th ECS Meeting
PublisherElectrochemical Society Inc.
Pages113-119
Number of pages7
Edition24
ISBN (Electronic)9781566777971
ISBN (Print)9781566777971
DOIs
Publication statusPublished - 2009
Externally publishedYes

Publication series

NameECS Transactions
Number24
Volume25
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

ASJC Scopus subject areas

  • Engineering(all)

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