Efficient PSD constrained asymmetric metric learning for person re-identification

Shengcai Liao, Stan Z. Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

403 Citations (Scopus)

Abstract

Person re-identification is becoming a hot research topic due to its value in both machine learning research and video surveillance applications. For this challenging problem, distance metric learning is shown to be effective in matching person images. However, existing approaches either require a heavy computation due to the positive semidefinite (PSD) constraint, or ignore the PSD constraint and learn a free distance function that makes the learned metric potentially noisy. We argue that the PSD constraint provides a useful regularization to smooth the solution of the metric, and hence the learned metric is more robust than without the PSD constraint. Another problem with metric learning algorithms is that the number of positive sample pairs is very limited, and the learning process is largely dominated by the large amount of negative sample pairs. To address the above issues, we derive a logistic metric learning approach with the PSD constraint and an asymmetric sample weighting strategy. Besides, we successfully apply the accelerated proximal gradient approach to find a global minimum solution of the proposed formulation, with a convergence rate of O(1/t 2) where t is the number of iterations. The proposed algorithm termed MLAPG is shown to be computationally efficient and able to perform low rank selection. We applied the proposed method for person re-identification, achieving state-of-the-art performance on four challenging databases (VIPeR, QMUL GRID, CUHK Campus, and CUHK03), compared to existing metric learning methods as well as published results.

Original languageEnglish
Title of host publication2015 International Conference on Computer Vision, ICCV 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3685-3693
Number of pages9
ISBN (Electronic)9781467383912
DOIs
Publication statusPublished - Feb 17 2015
Externally publishedYes
Event15th IEEE International Conference on Computer Vision, ICCV 2015 - Santiago, Chile
Duration: Dec 11 2015Dec 18 2015

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
Volume2015 International Conference on Computer Vision, ICCV 2015
ISSN (Print)1550-5499

Conference

Conference15th IEEE International Conference on Computer Vision, ICCV 2015
Country/TerritoryChile
CitySantiago
Period12/11/1512/18/15

ASJC Scopus subject areas

  • Software
  • Computer Vision and Pattern Recognition

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