Evidence for narrow mid-gap defect band in amorphous selenium from low-temperature anomalous electrical properties

Sunil Thomas, Naser Qamhieh, Saleh T. Mahmoud, Guy J. Adriaenssens

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Electrical properties of amorphous selenium films (~2.1 μm thick) were investigated at different temperatures between 225 K and room temperature. The samples were prepared using thermal evaporation method. The capacitance and conductance were measured and analyzed to study their changes with temperature and voltage. An anomalous peak is found in the conductance- and capacitance-temperature curves at ~245 K. The phenomenon can be linked to the distribution of defect states near the mid-gap and the change in ‘effective transport energy’ at which the transport takes place.

Original languageEnglish
Article number412139
JournalPhysica B: Condensed Matter
Volume586
DOIs
Publication statusPublished - Jun 1 2020

Keywords

  • Capacitance
  • Conductance
  • Deep defects
  • Electrical properties
  • Selenium

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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