Evidence of filamentary switching in oxide-based memory devices via weak programming and retention failure analysis

Adnan Younis, Dewei Chu, Sean Li

Research output: Contribution to journalArticlepeer-review

37 Citations (Scopus)

Abstract

Further progress in high-performance microelectronic devices relies on the development of novel materials and device architectures. However, the components and designs that are currently in use have reached their physical limits. Intensive research efforts, ranging from device fabrication to performance evaluation, are required to surmount these limitations. In this paper, we demonstrate that the superior bipolar resistive switching characteristics of a CeO 2:Gd-based memory device can be manipulated by means of UV radiation, serving as a new degree of freedom. Furthermore, the metal oxide-based (CeO 2:Gd) memory device was found to possess electrical and neuromorphic multifunctionalities. To investigate the underlying switching mechanism of the device, its plasticity behaviour was studied by imposing weak programming conditions. In addition, a short-term to long-term memory transition analogous to the forgetting process in the human brain, which is regarded as a key biological synaptic function for information processing and data storage, was realized. Based on a careful examination of the device's retention behaviour at elevated temperatures, the filamentary nature of switching in such devices can be understood from a new perspective.

Original languageEnglish
Article number13599
JournalScientific reports
Volume5
DOIs
Publication statusPublished - Sept 1 2015
Externally publishedYes

ASJC Scopus subject areas

  • General

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