Exploring structural information and fusing multiple features for person re-identification

Yang Hu, Shengcai Liao, Zhen Lei, Dong Yi, Stan Z. Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

44 Citations (Scopus)

Abstract

Recently, methods with learning procedure have been widely used to solve person re-identification (re-id) problem. However, most existing databases for re-id are smallscale, therefore, over-fitting is likely to occur. To further improve the performance, we propose a novel method by fusing multiple local features and exploring their structural information on different levels. The proposed method is called Structural Constraints Enhanced Feature Accumulation (SCEFA). Three local features (i.e., Hierarchical Weighted Histograms (HWH), Gabor Ternary Pattern HSV (GTP-HSV), Maximally Stable Color Regions (MSCR)) are used. Structural information of these features are deeply explored in three levels: pixel, blob, and part. The matching algorithms corresponding to the features are also discussed. Extensive experiments conducted on three datasets: VIPeR, ETHZ and our own challenging dataset MCSSH, show that our approach outperforms stat-of-the-art methods significantly.

Original languageEnglish
Title of host publicationProceedings - 2013 IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2013
Pages794-799
Number of pages6
DOIs
Publication statusPublished - 2013
Externally publishedYes
Event2013 IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2013 - Portland, OR, United States
Duration: Jun 23 2013Jun 28 2013

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2013 IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2013
Country/TerritoryUnited States
CityPortland, OR
Period6/23/136/28/13

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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