High-speed noise robust threshold gates

V. Beiu

Research output: Contribution to conferencePaperpeer-review

4 Citations (Scopus)

Abstract

This paper a systematic details method for significantly improving the noise margins of very fast threshold gates, by adding nonlinear terms determined from the Boolean form of the function to be implemented. Simulation results support our theoretical claims. Methods for reducing the power consumption are also suggested.

Original languageEnglish
Pages79-82
Number of pages4
Publication statusPublished - 2000
Externally publishedYes
Event2000 International Semiconductor Conference - Sinaia, Romania
Duration: Oct 10 2000Oct 14 2000

Conference

Conference2000 International Semiconductor Conference
Country/TerritoryRomania
CitySinaia
Period10/10/0010/14/00

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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