@inproceedings{58f50f22972a4e94ab8b87f029571e2c,
title = "How much input vectors affect nano-circuit's reliability estimates",
abstract = "As the sizes of (nano-)devices are aggressively scaled deep towards the nanometer range, the design and manufacturing of future (nano-)circuits will become extremely complex and inevitably introduce more defects, while their functioning will be adversely affected by (transient) faults. Therefore, accurately calculating the reliability of future designs will become a very important factor for (nano-)circuit designers as they investigate several alternatives for optimizing the trade-offs between the conflicting metrics of area-power-energy-delay versus reliability. This paper studies the effect of the input vectors on the (nano-)circuit's reliability, and introduces a time-efficient method for quickly and accurately identifying the lower/upper reliability bounds. Simulations results support the claim that the absolute difference between the lowest and the highest achievable reliability is of one-to-two orders of magnitude. Therefore, future designs should consider the worst case input vector(s) in order to guarantee the required reliability margins.",
keywords = "Input vectors, Insert, Nano-circuits, Reliability, Styling",
author = "Walid Ibrahim and Valeriu Beiu and Hoda Amer",
year = "2009",
language = "English",
isbn = "9789810836948",
series = "2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009",
pages = "699--702",
booktitle = "2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009",
note = "2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009 ; Conference date: 26-07-2009 Through 30-07-2009",
}