Influence of temperature on the electrical properties of selenium thin films

Sunil Thomas; Naser Qamhieh; Saleh T. Mahmoud

doi:10.1063/1.5130356

Influence of temperature on the electrical properties of selenium thin films

Sunil Thomas, Naser Qamhieh, Saleh T. Mahmoud

Department of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

Abstract

In the present study, selenium thin films of thickness ∼2.1 μm were synthesized using thermal evaporation method. The presence of selenium in the sample was confirmed using energy dispersive spectrum. Vibration analysis of the structural groups in the samples, before and after annealing, was carried out using Raman spectroscopy. The crystallization of the sample due to annealing was studied using X-ray diffraction. The change in the energy band gap of the film due to annealing was estimated from the Urbach edge of the absorption spectrum. Electrical properties namely conductance and capacitance at different voltages were investigated. Changes in the conductance and capacitance when heating the sample from room temperature to 400 K were studied.

Original language	English
Title of host publication	Proceedings of the International Conference on Advanced Materials, ICAM 2019
Editors	Kishor Kumar Sadasivuni, Joji Kurian, Sudheesh Vilasini Damodaran, Joshy Joseph, Deepu Joseph, Emmanuel Tom, Deepu Thomas
Publisher	American Institute of Physics Inc.
ISBN (Electronic)	9780735419070
DOIs	https://doi.org/10.1063/1.5130356
Publication status	Published - Oct 29 2019
Event	International Conference on Advanced Materials, ICAM 2019 - Kuthuparamba, Kannur, Kerala, India Duration: Jun 12 2019 → Jun 14 2019

Publication series

Name	AIP Conference Proceedings
Volume	2162
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	International Conference on Advanced Materials, ICAM 2019
Country/Territory	India
City	Kuthuparamba, Kannur, Kerala
Period	6/12/19 → 6/14/19

ASJC Scopus subject areas

General Physics and Astronomy

Access to Document

10.1063/1.5130356

Cite this

Thomas, S., Qamhieh, N., & Mahmoud, S. T. (2019). Influence of temperature on the electrical properties of selenium thin films. In K. K. Sadasivuni, J. Kurian, S. V. Damodaran, J. Joseph, D. Joseph, E. Tom, & D. Thomas (Eds.), Proceedings of the International Conference on Advanced Materials, ICAM 2019 Article 020146 (AIP Conference Proceedings; Vol. 2162). American Institute of Physics Inc.. https://doi.org/10.1063/1.5130356

Influence of temperature on the electrical properties of selenium thin films. / Thomas, Sunil; Qamhieh, Naser ; Mahmoud, Saleh T.
Proceedings of the International Conference on Advanced Materials, ICAM 2019. ed. / Kishor Kumar Sadasivuni; Joji Kurian; Sudheesh Vilasini Damodaran; Joshy Joseph; Deepu Joseph; Emmanuel Tom; Deepu Thomas. American Institute of Physics Inc., 2019. 020146 (AIP Conference Proceedings; Vol. 2162).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Thomas, S, Qamhieh, N & Mahmoud, ST 2019, Influence of temperature on the electrical properties of selenium thin films. in KK Sadasivuni, J Kurian, SV Damodaran, J Joseph, D Joseph, E Tom & D Thomas (eds), Proceedings of the International Conference on Advanced Materials, ICAM 2019., 020146, AIP Conference Proceedings, vol. 2162, American Institute of Physics Inc., International Conference on Advanced Materials, ICAM 2019, Kuthuparamba, Kannur, Kerala, India, 6/12/19. https://doi.org/10.1063/1.5130356

Thomas S, Qamhieh N , Mahmoud ST. Influence of temperature on the electrical properties of selenium thin films. In Sadasivuni KK, Kurian J, Damodaran SV, Joseph J, Joseph D, Tom E, Thomas D, editors, Proceedings of the International Conference on Advanced Materials, ICAM 2019. American Institute of Physics Inc. 2019. 020146. (AIP Conference Proceedings). doi: 10.1063/1.5130356

Thomas, Sunil ; Qamhieh, Naser ; Mahmoud, Saleh T. / Influence of temperature on the electrical properties of selenium thin films. Proceedings of the International Conference on Advanced Materials, ICAM 2019. editor / Kishor Kumar Sadasivuni ; Joji Kurian ; Sudheesh Vilasini Damodaran ; Joshy Joseph ; Deepu Joseph ; Emmanuel Tom ; Deepu Thomas. American Institute of Physics Inc., 2019. (AIP Conference Proceedings).

@inproceedings{ae438a1127ed46b1829bc94e46c853fa,

title = "Influence of temperature on the electrical properties of selenium thin films",

abstract = "In the present study, selenium thin films of thickness ∼2.1 μm were synthesized using thermal evaporation method. The presence of selenium in the sample was confirmed using energy dispersive spectrum. Vibration analysis of the structural groups in the samples, before and after annealing, was carried out using Raman spectroscopy. The crystallization of the sample due to annealing was studied using X-ray diffraction. The change in the energy band gap of the film due to annealing was estimated from the Urbach edge of the absorption spectrum. Electrical properties namely conductance and capacitance at different voltages were investigated. Changes in the conductance and capacitance when heating the sample from room temperature to 400 K were studied.",

author = "Sunil Thomas and Naser Qamhieh and Mahmoud, {Saleh T.}",

note = "Publisher Copyright: {\textcopyright} 2019 Author(s).; International Conference on Advanced Materials, ICAM 2019 ; Conference date: 12-06-2019 Through 14-06-2019",

year = "2019",

month = oct,

day = "29",

doi = "10.1063/1.5130356",

language = "English",

series = "AIP Conference Proceedings",

publisher = "American Institute of Physics Inc.",

editor = "Sadasivuni, {Kishor Kumar} and Joji Kurian and Damodaran, {Sudheesh Vilasini} and Joshy Joseph and Deepu Joseph and Emmanuel Tom and Deepu Thomas",

booktitle = "Proceedings of the International Conference on Advanced Materials, ICAM 2019",

}

TY - GEN

T1 - Influence of temperature on the electrical properties of selenium thin films

AU - Thomas, Sunil

AU - Qamhieh, Naser

AU - Mahmoud, Saleh T.

PY - 2019/10/29

Y1 - 2019/10/29

N2 - In the present study, selenium thin films of thickness ∼2.1 μm were synthesized using thermal evaporation method. The presence of selenium in the sample was confirmed using energy dispersive spectrum. Vibration analysis of the structural groups in the samples, before and after annealing, was carried out using Raman spectroscopy. The crystallization of the sample due to annealing was studied using X-ray diffraction. The change in the energy band gap of the film due to annealing was estimated from the Urbach edge of the absorption spectrum. Electrical properties namely conductance and capacitance at different voltages were investigated. Changes in the conductance and capacitance when heating the sample from room temperature to 400 K were studied.

AB - In the present study, selenium thin films of thickness ∼2.1 μm were synthesized using thermal evaporation method. The presence of selenium in the sample was confirmed using energy dispersive spectrum. Vibration analysis of the structural groups in the samples, before and after annealing, was carried out using Raman spectroscopy. The crystallization of the sample due to annealing was studied using X-ray diffraction. The change in the energy band gap of the film due to annealing was estimated from the Urbach edge of the absorption spectrum. Electrical properties namely conductance and capacitance at different voltages were investigated. Changes in the conductance and capacitance when heating the sample from room temperature to 400 K were studied.

UR - http://www.scopus.com/inward/record.url?scp=85074778188&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85074778188&partnerID=8YFLogxK

U2 - 10.1063/1.5130356

DO - 10.1063/1.5130356

M3 - Conference contribution

AN - SCOPUS:85074778188

T3 - AIP Conference Proceedings

BT - Proceedings of the International Conference on Advanced Materials, ICAM 2019

A2 - Sadasivuni, Kishor Kumar

A2 - Kurian, Joji

A2 - Damodaran, Sudheesh Vilasini

A2 - Joseph, Joshy

A2 - Joseph, Deepu

A2 - Tom, Emmanuel

A2 - Thomas, Deepu

PB - American Institute of Physics Inc.

T2 - International Conference on Advanced Materials, ICAM 2019

Y2 - 12 June 2019 through 14 June 2019

ER -

Influence of temperature on the electrical properties of selenium thin films

Abstract

Publication series

Conference

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this