Samarium (Sm) doped aluminum nitride (AlN) thin films are deposited on silicon (100) substrates at 77 K by rf magnetron sputtering method. Thick films of 200 nm are grown at 100-200 watts RF power and 5-8 m Torr nitrogen, using a metal target of Al with Sm. X-ray diffraction results show that films are amorphous. Cathodoluminescence (CL) studies are performed and four peaks are observed in Sm at 564, 600, 648, and 707 nm as a result of 4G 5/2 → 6H 5/2, 4G 5/2 → 6H 7/2, 4G 5/2 → 6H 9/2, and 4G 5/2 → 6H 11/2 transitions. Photoluminescence (PL) provides dominant peaks at 600 and 707 nm while CL gives the intense peaks at 600 nm and 648 nm, respectively. Films are thermally activated at 1,200 K for half an hour in a nitrogen atmosphere. Thermal activation enhances the intensity of luminescence.
|Number of pages||5|
|Journal||Nanoscale Research Letters|
|Publication status||Published - Jul 2009|
- Thermal activation
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics