@inproceedings{148a8fa8c774426989b457f47d4bbf71,
title = "Losses characterization of tunable barium strontium titanate materials integrated on silicon substrate",
abstract = "The optimizations of the growth of barium strontium titanate (BST) on silicon substrate requires very accurate characterization method of its intrinsic losses. The total losses in the structure are computed from its measured tuned RF performance for different applied bias and then a full deembedding of the ohmic losses is carried out by the substraction of the total losses at zero bias, enabling the intrinsic-loss of the BST this film to be extracted. The losses of the BST material is both frequency and voltage dependent. The losses of the BST found to be frequency dependent up to 10 GHz.",
keywords = "BST, Characterization, Loss, Material parameters, Thin film, Tunable circuit",
author = "{Al Ahmad}, Mahmoud and Robert Plana",
year = "2008",
doi = "10.1109/SMIC.2008.46",
language = "English",
isbn = "9781424418558",
series = "2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systms - Digest of Papers, SiRF",
pages = "159--162",
booktitle = "2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Digest of Papers, SiRF",
note = "2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF ; Conference date: 23-01-2008 Through 25-01-2008",
}