Low Activity-Factor Test Pattern Generation

Engineering

• Switching Activity 100%
• Electric Power Utilization 50%
• Genetic Algorithm 50%
• Digital Circuits 50%
• Test Time 50%
• Energy Dissipation 50%
• Combinatorial Circuits 50%
• Test Equipment 50%

Keyphrases

• Test Pattern 100%
• Small Circuits 33%
• Low Switching Activity 33%
• High Switching 33%
• Pseudorandom Test 33%
• Reduced Switching 33%