Skip to main navigation Skip to search Skip to main content

Monte Carlo analysis of the static noise margins for CMOS gates in predictive technology models

  • N. V. Acharya
  • , J. L. Raju
  • , A. Kumar
  • , M. Tache
  • , V. Beiu

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    5   Link opens in a new tab Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Monte Carlo analysis of the static noise margins for CMOS gates in predictive technology models'. Together they form a unique fingerprint.
    Sort by

    Keyphrases

    Engineering

    Material Science

    Agricultural and Biological Sciences

    Computer Science