TY - GEN
T1 - Multiplexing schemes in single-electron technology
AU - Sulieman, Mawahib H.
AU - Beiu, Valeriu
PY - 2006
Y1 - 2006
N2 - This paper investigates multiplexing schemes in single-electron technology (SET). The study focuses on the behavior of two multiplexing schemes in combination with gates subject to geometric variations affecting their elementary components (capacitors). The two schemes under investigation are MAJORITY- and NAND-multiplexing. First, the elementary gates are compared in terms of their intrinsic probability of failure with respect to variations. Secondly, the two multiplexing schemes are weighted against the reliability enhancements they are able to bring into the system. This study gives a deeper insight into the behavior of fault-tolerant multiplexing schemes. It also shows how the logic styles, as well as the technology, could affect the overall reliability of a multiplexed system. Such aspects have been normally neglected, but should be carefully considered in the design of future nanoarchitectures.
AB - This paper investigates multiplexing schemes in single-electron technology (SET). The study focuses on the behavior of two multiplexing schemes in combination with gates subject to geometric variations affecting their elementary components (capacitors). The two schemes under investigation are MAJORITY- and NAND-multiplexing. First, the elementary gates are compared in terms of their intrinsic probability of failure with respect to variations. Secondly, the two multiplexing schemes are weighted against the reliability enhancements they are able to bring into the system. This study gives a deeper insight into the behavior of fault-tolerant multiplexing schemes. It also shows how the logic styles, as well as the technology, could affect the overall reliability of a multiplexed system. Such aspects have been normally neglected, but should be carefully considered in the design of future nanoarchitectures.
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U2 - 10.1109/aiccsa.2006.205125
DO - 10.1109/aiccsa.2006.205125
M3 - Conference contribution
AN - SCOPUS:33750801296
SN - 1424402123
SN - 9781424402120
T3 - IEEE International Conference on Computer Systems and Applications, 2006
SP - 424
EP - 428
BT - IEEE International Conference on Computer Systems and Applications, 2006
PB - IEEE Computer Society
T2 - IEEE International Conference on Computer Systems and Applications, 2006
Y2 - 8 March 2006 through 8 March 2006
ER -