Abstract
Modern network packet processing applications such as Intrusion Detection System (IDS) perform packet filtering and deep packet inspection (DPI), also known as packet content inspection. Fundamentally, for packet filtering, these applications attempt to use the contents of some header fields of the network, transport and application layers of the packets. While for DPI, these applications use attack signature rules to search for predefined patterns in the packet application header fields or payload data. This paper discusses a hybrid mechanism based on the use of splay tree filters and pattern-matching algorithms to enhance IDS packet filtering and DPI performance, respectively. The proposed mechanism uses network traffic statistics to dynamically optimize the order of the splay tree filters, allowing early acceptance and rejection of network packets. In addition, DPI signature rules are reordered according to their matching frequencies, allowing early packets acceptance. We demonstrate the merit of our mechanism through simulations performed on Snort's string set.
Original language | English |
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Title of host publication | Proceedings - IEEE 30th International Conference on Advanced Information Networking and Applications, IEEE AINA 2016 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 808-815 |
Number of pages | 8 |
Volume | 2016-May |
ISBN (Electronic) | 9781509018574 |
DOIs | |
Publication status | Published - May 19 2016 |
Event | 30th IEEE International Conference on Advanced Information Networking and Applications, AINA 2016 - Crans-Montana, Switzerland Duration: Mar 23 2016 → Mar 25 2016 |
Other
Other | 30th IEEE International Conference on Advanced Information Networking and Applications, AINA 2016 |
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Country/Territory | Switzerland |
City | Crans-Montana |
Period | 3/23/16 → 3/25/16 |
Keywords
- Binary Search on Prefix Length
- Deep Packet inspection
- Network intrusion detection
- Network traffic statistics
- Packet filtering
- Pattern matching
- Splay Tree
ASJC Scopus subject areas
- Engineering(all)