NEXAFS N K-edge study of the bonding structure on Al/Si doped sputtered CrN coatings

M. Mahbubur Rahman, Zhong Tao Jiang, Xiaofei Duan, Zonghan Xie, Anton Tadich, Zhi Feng Zhou, Nicholas Mondinos, Chun Yang Yin, Mohammednoor Altarawneh, Bogdan Z. Dlugogorski

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Abstract

Chromium nitride (CrN)-based materials display broad applications as protective coatings for automotive, power generation and aerospace industries, in which surfaces are often subjected to wear and corrosion. By using an appropriate choice of dopant, one can further increase the mechanical hardness, corrosion and oxidation resistance of these coatings. In order to identify the effect of dopants on the structural evolution and surface electronic properties of CrN coatings, Cr1-z(Al/Si)zN coatings were prepared by magnetron sputtering and then characterized via X-ray diffraction (XRD) and soft X-ray synchrotron radiation Near-edge X-ray Absorption Fine Structure (NEXAFS) studies around N K-edge. Higher degree of crystallinity of the coatings were identified through XRD studies. The bonding structure, of the doped CrN coating, was analyzed by Near-edge X-ray Absorption Fine Structure (NEXAFS) measurements performed around the N K-edge (390-450 eV) in the Auger electron yield (AEY) and total fluorescence yield (TFY) modes. NEXAFS analysis revealed Cr3d(Al3p/Si3p)N2p hybridizations in Cr1-z(Al/Si)zN compositions and complex structure splitting via spin-orbit interaction of the Cr3d levels.

Original languageEnglish
Pages (from-to)268-273
Number of pages6
JournalJournal of Alloys and Compounds
Volume661
DOIs
Publication statusPublished - Mar 15 2016
Externally publishedYes

Keywords

  • CrN coatings
  • Doping
  • Electronic structure
  • Grain boundary
  • NEXAFS
  • Sputtering
  • Synchrotron radiation

ASJC Scopus subject areas

  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

Fingerprint

Dive into the research topics of 'NEXAFS N K-edge study of the bonding structure on Al/Si doped sputtered CrN coatings'. Together they form a unique fingerprint.

Cite this