Novel heuristic and genetic algorithms for the VLSI test coverage problem

Walid Ibrahim, Amr El-Chouemi, Hesham El-Sayed

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Fingerprint

    Dive into the research topics of 'Novel heuristic and genetic algorithms for the VLSI test coverage problem'. Together they form a unique fingerprint.

    Engineering & Materials Science