Offset loopback test for IC RF transceivers

J. J. Da̧browski, R. M. Ramzan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

In this paper we develop an offset loopback test setup for integrated RF transceivers (TRx's). Basically, addressed are architectures, which are not suitable for direct loopback test such as FDD transceivers or TDD transceivers where the transmitter (Tx) and receiver (Rx) share one frequency synthesizer (called VCO modulating TRx's). The technique makes use of an extra mixer put on chip to compensate for the incompatibility of the Tx and Rx, i.e. to compensate for a difference between the transmit- and the receive frequency, and/or to introduce a baseband signal needed for test. We discuss the problem in terms of system-level models, which are implemented and verified in Matlab™.

Original languageEnglish
Title of host publicationProceedings of the International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2006
Pages583-586
Number of pages4
Publication statusPublished - 2006
Externally publishedYes
EventInternational Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2006 - Gdynia, Poland
Duration: Jun 22 2006Jun 24 2006

Publication series

NameProceedings of the International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2006

Other

OtherInternational Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2006
Country/TerritoryPoland
CityGdynia
Period6/22/066/24/06

Keywords

  • DfT
  • RF test
  • RF-CMOS design
  • Radio transceivers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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