On 2-dimensional consecutive systems once again

Valeriu Beiu; Leonard Daus

doi:10.1109/NANO.2015.7388638

On 2-dimensional consecutive systems once again

Valeriu Beiu, Leonard Daus

Department of Mathematical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Citations (Scopus)

Abstract

Consecutive systems are attractive due to their potential for enhancing nano-architectures, as being able to significantly boost reliability. Additionally, communication at the nanoscale is also going to need methods allowing to achieve lower transmission bit error rates. In particular, nano-technologies like, e.g., molecular, nano-magnetic, nano-fluidic, and even FinFETs, should benefit from consecutive systems, a well-established redundancy scheme. This paper will start by briefly mentioning previous results for 1-dimensional linear consecutive-k-out-of-n:F systems with statistically independent components having the same failure probability q, before focusing on 2-dimensional consecutive systems and their variations. We shall go over a few bounds for estimating their reliability and shall present simulations for particular 2-dimensional cases. These will show that bounds are quite accurate, some of them even matching the reliability of the particular 2-dimensional consecutive systems considered. Conclusions are ending the paper.

Original language	English
Title of host publication	IEEE-NANO 2015 - 15th International Conference on Nanotechnology
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	464-467
Number of pages	4
ISBN (Electronic)	9781467381550
DOIs	https://doi.org/10.1109/NANO.2015.7388638
Publication status	Published - 2015
Event	15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015 - Rome, Italy Duration: Jul 27 2015 → Jul 30 2015

Publication series

Name	IEEE-NANO 2015 - 15th International Conference on Nanotechnology

Other

Other	15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015
Country/Territory	Italy
City	Rome
Period	7/27/15 → 7/30/15

Keywords

Reliability
bounds
consecutive systems

ASJC Scopus subject areas

Process Chemistry and Technology
Electrical and Electronic Engineering
Ceramics and Composites
Electronic, Optical and Magnetic Materials
Surfaces, Coatings and Films

Access to Document

10.1109/NANO.2015.7388638

Cite this

On 2-dimensional consecutive systems once again. / Beiu, Valeriu; Daus, Leonard.
IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc., 2015. p. 464-467 7388638 (IEEE-NANO 2015 - 15th International Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Beiu, V & Daus, L 2015, On 2-dimensional consecutive systems once again. in IEEE-NANO 2015 - 15th International Conference on Nanotechnology., 7388638, IEEE-NANO 2015 - 15th International Conference on Nanotechnology, Institute of Electrical and Electronics Engineers Inc., pp. 464-467, 15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015, Rome, Italy, 7/27/15. https://doi.org/10.1109/NANO.2015.7388638

@inproceedings{6ac8da8f349644ffa63043b0069c2d11,

title = "On 2-dimensional consecutive systems once again",

abstract = "Consecutive systems are attractive due to their potential for enhancing nano-architectures, as being able to significantly boost reliability. Additionally, communication at the nanoscale is also going to need methods allowing to achieve lower transmission bit error rates. In particular, nano-technologies like, e.g., molecular, nano-magnetic, nano-fluidic, and even FinFETs, should benefit from consecutive systems, a well-established redundancy scheme. This paper will start by briefly mentioning previous results for 1-dimensional linear consecutive-k-out-of-n:F systems with statistically independent components having the same failure probability q, before focusing on 2-dimensional consecutive systems and their variations. We shall go over a few bounds for estimating their reliability and shall present simulations for particular 2-dimensional cases. These will show that bounds are quite accurate, some of them even matching the reliability of the particular 2-dimensional consecutive systems considered. Conclusions are ending the paper.",

keywords = "Reliability, bounds, consecutive systems",

author = "Valeriu Beiu and Leonard Daus",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015 ; Conference date: 27-07-2015 Through 30-07-2015",

year = "2015",

doi = "10.1109/NANO.2015.7388638",

language = "English",

series = "IEEE-NANO 2015 - 15th International Conference on Nanotechnology",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "464--467",

booktitle = "IEEE-NANO 2015 - 15th International Conference on Nanotechnology",

}

TY - GEN

T1 - On 2-dimensional consecutive systems once again

AU - Beiu, Valeriu

AU - Daus, Leonard

PY - 2015

Y1 - 2015

N2 - Consecutive systems are attractive due to their potential for enhancing nano-architectures, as being able to significantly boost reliability. Additionally, communication at the nanoscale is also going to need methods allowing to achieve lower transmission bit error rates. In particular, nano-technologies like, e.g., molecular, nano-magnetic, nano-fluidic, and even FinFETs, should benefit from consecutive systems, a well-established redundancy scheme. This paper will start by briefly mentioning previous results for 1-dimensional linear consecutive-k-out-of-n:F systems with statistically independent components having the same failure probability q, before focusing on 2-dimensional consecutive systems and their variations. We shall go over a few bounds for estimating their reliability and shall present simulations for particular 2-dimensional cases. These will show that bounds are quite accurate, some of them even matching the reliability of the particular 2-dimensional consecutive systems considered. Conclusions are ending the paper.

AB - Consecutive systems are attractive due to their potential for enhancing nano-architectures, as being able to significantly boost reliability. Additionally, communication at the nanoscale is also going to need methods allowing to achieve lower transmission bit error rates. In particular, nano-technologies like, e.g., molecular, nano-magnetic, nano-fluidic, and even FinFETs, should benefit from consecutive systems, a well-established redundancy scheme. This paper will start by briefly mentioning previous results for 1-dimensional linear consecutive-k-out-of-n:F systems with statistically independent components having the same failure probability q, before focusing on 2-dimensional consecutive systems and their variations. We shall go over a few bounds for estimating their reliability and shall present simulations for particular 2-dimensional cases. These will show that bounds are quite accurate, some of them even matching the reliability of the particular 2-dimensional consecutive systems considered. Conclusions are ending the paper.

KW - Reliability

KW - bounds

KW - consecutive systems

UR - http://www.scopus.com/inward/record.url?scp=84964331104&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84964331104&partnerID=8YFLogxK

U2 - 10.1109/NANO.2015.7388638

DO - 10.1109/NANO.2015.7388638

M3 - Conference contribution

AN - SCOPUS:84964331104

T3 - IEEE-NANO 2015 - 15th International Conference on Nanotechnology

SP - 464

EP - 467

BT - IEEE-NANO 2015 - 15th International Conference on Nanotechnology

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015

Y2 - 27 July 2015 through 30 July 2015

ER -

On 2-dimensional consecutive systems once again

Abstract

Publication series

Other

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this