TY - GEN
T1 - On-chip calibration of RF detectors by DC stimuli and artificial neural networks
AU - Ramzan, Rashad
AU - Da̧browski, Jerzy
PY - 2008
Y1 - 2008
N2 - In the nanometer regime, especially the RF and analog circuits exhibit wide parameter variability, and consequently every chip produced needs to be tested. On-chip Design for Testability (DfT) features, which are meant to reduce test time and cost also suffer from parameter variability. Therefore, RF calibration of all on-chip test structures is mandatory. In this paper, Artificial Neural Networks (ANN) are employed as multivariate regression technique to architect a general RF calibration scheme using DC- instead of RF stimuli. This relaxes the routing requirements on a chip for GHz test signals along with the reduction in test time and cost. The RF detector, a key element of a radio front-end DfT circuitry, designed in 65nm CMOS is used to demonstrate the calibration scheme.
AB - In the nanometer regime, especially the RF and analog circuits exhibit wide parameter variability, and consequently every chip produced needs to be tested. On-chip Design for Testability (DfT) features, which are meant to reduce test time and cost also suffer from parameter variability. Therefore, RF calibration of all on-chip test structures is mandatory. In this paper, Artificial Neural Networks (ANN) are employed as multivariate regression technique to architect a general RF calibration scheme using DC- instead of RF stimuli. This relaxes the routing requirements on a chip for GHz test signals along with the reduction in test time and cost. The RF detector, a key element of a radio front-end DfT circuitry, designed in 65nm CMOS is used to demonstrate the calibration scheme.
KW - ANN application
KW - On-chip RF detector
KW - RF BIST
KW - RF DfT
KW - RF calibration
KW - RF testing
UR - http://www.scopus.com/inward/record.url?scp=51849123791&partnerID=8YFLogxK
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U2 - 10.1109/RFIC.2008.4561502
DO - 10.1109/RFIC.2008.4561502
M3 - Conference contribution
AN - SCOPUS:51849123791
SN - 9781424418091
T3 - Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
SP - 571
EP - 574
BT - Proceedings of the 2008 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2008
T2 - 2008 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2008
Y2 - 15 June 2008 through 17 June 2008
ER -