On-chip stimulus generator for gain, linearity, and blocking profile test of wideband RF front ends

Keyphrases

• Wideband 100%
• RF Front-end 100%
• Voltage Controlled Ring Oscillator 100%
• Stimulus Generator 100%
• On chip 100%
• Gain Nonlinearity 100%
• 1-dB Compression Point 50%
• Error Value 25%
• Low Noise 25%
• Adjustable Output 25%
• Phase Noise 25%
• Measured Gain 25%
• Noise Voltage 25%
• Oscillation Frequency 25%
• Delay Line 25%
• Single Tone 25%
• RF Test 25%
• Production Test 25%
• Differential Delay 25%
• Two-tone Signal 25%
• Test Circuit 25%
• Coupling Capacitor 25%
• Wideband Receiver 25%
• Silicon Area 25%
• Profile Measurement 25%
• Double Differential 25%
• Complementary Metal Oxide Semiconductor 25%
• Frequency Offset 25%
• Power Output 25%

Engineering

• Db Compression Point 100%
• Front End 100%
• Output Power 50%
• Measured Phase 50%
• Coupling Capacitor 50%
• Test Circuit 50%
• Phase Noise 50%
• Differential Delay 50%
• Noise Voltage 50%
• Error Value 50%
• Actual Value 50%
• Adders 50%
• Electric Delay Lines 50%