On practical multiplexing issues

Valeriu Beiu, Mawahib H. Sulieman

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    9 Citations (Scopus)


    This paper investigates the behavior of multiplexing schemes in combination with elementary gates. The two schemes under investigation are MAJORITY- and NAND-multiplexing. The simulation results are for single-electron technology (SET), where the elementary components of the gates (capacitors in the case of capacitive-SET) are subjected to geometric variations. First, the elementary gates are compared in terms of their intrinsic probability of failure with respect to variations. Secondly, the two multiplexing schemes are weighted against the reliability enhancements they are able to bring into the system. This study gives insights into the behavior of fault-tolerant multiplexing schemes and shows how the logic styles, as well as the technology, could affect the overall reliability of a multiplexed system. Such aspects should be carefully weighted for the design of future nano-architectures.

    Original languageEnglish
    Title of host publication2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Number of pages4
    ISBN (Print)1424400783, 9781424400782
    Publication statusPublished - 2006
    Event2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006 - Cincinnati, OH, United States
    Duration: Jun 17 2006Jun 20 2006

    Publication series

    Name2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006


    Other2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
    Country/TerritoryUnited States
    CityCincinnati, OH


    • Fault-tolerance
    • Multiplexing
    • Reliability
    • Single electron technology (SET)

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • General Materials Science


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