TY - GEN
T1 - On practical multiplexing issues
AU - Beiu, Valeriu
AU - Sulieman, Mawahib H.
PY - 2006
Y1 - 2006
N2 - This paper investigates the behavior of multiplexing schemes in combination with elementary gates. The two schemes under investigation are MAJORITY- and NAND-multiplexing. The simulation results are for single-electron technology (SET), where the elementary components of the gates (capacitors in the case of capacitive-SET) are subjected to geometric variations. First, the elementary gates are compared in terms of their intrinsic probability of failure with respect to variations. Secondly, the two multiplexing schemes are weighted against the reliability enhancements they are able to bring into the system. This study gives insights into the behavior of fault-tolerant multiplexing schemes and shows how the logic styles, as well as the technology, could affect the overall reliability of a multiplexed system. Such aspects should be carefully weighted for the design of future nano-architectures.
AB - This paper investigates the behavior of multiplexing schemes in combination with elementary gates. The two schemes under investigation are MAJORITY- and NAND-multiplexing. The simulation results are for single-electron technology (SET), where the elementary components of the gates (capacitors in the case of capacitive-SET) are subjected to geometric variations. First, the elementary gates are compared in terms of their intrinsic probability of failure with respect to variations. Secondly, the two multiplexing schemes are weighted against the reliability enhancements they are able to bring into the system. This study gives insights into the behavior of fault-tolerant multiplexing schemes and shows how the logic styles, as well as the technology, could affect the overall reliability of a multiplexed system. Such aspects should be carefully weighted for the design of future nano-architectures.
KW - Fault-tolerance
KW - Multiplexing
KW - Reliability
KW - Single electron technology (SET)
UR - http://www.scopus.com/inward/record.url?scp=34548245717&partnerID=8YFLogxK
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U2 - 10.1109/nano.2006.247637
DO - 10.1109/nano.2006.247637
M3 - Conference contribution
AN - SCOPUS:34548245717
SN - 1424400783
SN - 9781424400782
T3 - 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
SP - 310
EP - 313
BT - 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
Y2 - 17 June 2006 through 20 June 2006
ER -