TY - GEN
T1 - On Schmitt trigger and other inverters
AU - Ibrahim, Walid
AU - Beiu, Valeriu
AU - Tache, Mihai
AU - Kharbash, Fekri
PY - 2013
Y1 - 2013
N2 - This paper compares classical CMOS versus Schmitt trigger (ST) inverters (INVs), sized both conventionally as well as unconventionally. The reason is that ST INVs are using positive feedback (which leads to hysteresis) and are expected to exhibit much better static noise margins (SNMs) than classical CMOS INVs. That is why ST INVs are more reliable. Lately, quite a few papers have been looking at using ST INVs for implementing SRAMs focusing mainly on the ultra-low voltage/power application range. Here we are going to look at SNM, delay, power and power-delay-product over the whole voltage range for exploring the potential advantages ST could offer in advanced CMOS technology nodes, and better identify their application range.
AB - This paper compares classical CMOS versus Schmitt trigger (ST) inverters (INVs), sized both conventionally as well as unconventionally. The reason is that ST INVs are using positive feedback (which leads to hysteresis) and are expected to exhibit much better static noise margins (SNMs) than classical CMOS INVs. That is why ST INVs are more reliable. Lately, quite a few papers have been looking at using ST INVs for implementing SRAMs focusing mainly on the ultra-low voltage/power application range. Here we are going to look at SNM, delay, power and power-delay-product over the whole voltage range for exploring the potential advantages ST could offer in advanced CMOS technology nodes, and better identify their application range.
KW - CMOS
KW - Schmitt trigger
KW - inverter
KW - sizing
KW - static noise margin (SNM)
UR - http://www.scopus.com/inward/record.url?scp=84901439654&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84901439654&partnerID=8YFLogxK
U2 - 10.1109/ICECS.2013.6815337
DO - 10.1109/ICECS.2013.6815337
M3 - Conference contribution
AN - SCOPUS:84901439654
SN - 9781479924523
T3 - Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems
SP - 29
EP - 32
BT - 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013
Y2 - 8 December 2013 through 11 December 2013
ER -