On teaching circuit reliability

    Research output: Contribution to journalConference articlepeer-review

    10 Citations (Scopus)


    Integrated circuits in the coming years are expected to be based on nano-scaled devices, such as single electron transistors, self-assembled DNA, carbon nano-tubes, and resonant tunnel diodes. Future designs based on such nano-devices will exhibit high integration densities, and might be either low power or fast switching but not both. Unfortunately, nano-devices suffer heavily from fabrication inconsistencies, and transient and permanent failures due to external causes. Therefore, circuit reliability will have to be added to the design space currently consisting of timing, area, and power. This also means that the reliability calculation/estimation could soon be an important topic in the undergraduate/graduate courses on circuit design. Probability transfer matrix numerical method has been used as an exact way to calculate the reliability of a circuit. Traditionally, the matrices are created manually, making the process tedious, time-consuming, and errorprone. This paper proposes an automatic tool (AutoPTMate) for generating ready-to-use MATLAB mfiles for calculating the circuit's reliability. The tool allows users to significantly speed-up the reliability assessment of a large number of circuits. The first potential users of such a tool are members of academia and R&D community.

    Original languageEnglish
    Article number4720347
    Pages (from-to)T3H12-T3H17
    JournalProceedings - Frontiers in Education Conference, FIE
    Publication statusPublished - 2008
    Event38th ASEE/IEEE Frontiers in Education Conference, FIE 2008 - Saratoga Springs, NY, United States
    Duration: Oct 22 2008Oct 25 2008


    • Active learning
    • Computer-aided design
    • Curricula
    • Fault tolerance
    • Nano-architecture
    • Probability transfer matrix (PTM)
    • Reliability
    • Teaching tools

    ASJC Scopus subject areas

    • Software
    • Education
    • Computer Science Applications


    Dive into the research topics of 'On teaching circuit reliability'. Together they form a unique fingerprint.

    Cite this