On using Schmitt trigger for digital logic

Valeriu Beiu; Mihai Tache

doi:10.1109/SMICND.2015.7355206

On using Schmitt trigger for digital logic

Valeriu Beiu, Mihai Tache

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

This paper looks at a classical CMOS NOR-2 gate as well as Schmitt trigger (ST) versions, when the transistors are sized conventionally and unconventionally. ST gates exhibit positive feedback leading to better static noise margins (SNMs), hence less sensitive to noises (i.e., more reliable). The ST concept has lately been used for SRAM cells, with a few papers targeting digital logic. Here we explore the whole voltage and performance range, characterizing SNM, power, delay, and power-delay-product of ST NOR-2 gates, with the aim of getting a better understanding of their advantages for digital logic.

Original language	English
Title of host publication	2015 38th International Semiconductor Conference, CAS 2015 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	197-200
Number of pages	4
ISBN (Electronic)	9781479988624
DOIs	https://doi.org/10.1109/SMICND.2015.7355206
Publication status	Published - Dec 11 2015
Externally published	Yes
Event	38th International Semiconductor Conference, CAS 2015 - Sinaia, Romania Duration: Oct 12 2015 → Oct 14 2015

Publication series

Name	Proceedings of the International Semiconductor Conference, CAS
Volume	2015-December

Conference

Conference	38th International Semiconductor Conference, CAS 2015
Country/Territory	Romania
City	Sinaia
Period	10/12/15 → 10/14/15

Keywords

CMOS
NOR-2
Schmitt trigger
power
reliability
sizing
static noise margin (SNM)

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/SMICND.2015.7355206

Cite this

On using Schmitt trigger for digital logic. / Beiu, Valeriu; Tache, Mihai.
2015 38th International Semiconductor Conference, CAS 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2015. p. 197-200 7355206 (Proceedings of the International Semiconductor Conference, CAS; Vol. 2015-December).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Beiu, V & Tache, M 2015, On using Schmitt trigger for digital logic. in 2015 38th International Semiconductor Conference, CAS 2015 - Proceedings., 7355206, Proceedings of the International Semiconductor Conference, CAS, vol. 2015-December, Institute of Electrical and Electronics Engineers Inc., pp. 197-200, 38th International Semiconductor Conference, CAS 2015, Sinaia, Romania, 10/12/15. https://doi.org/10.1109/SMICND.2015.7355206

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abstract = "This paper looks at a classical CMOS NOR-2 gate as well as Schmitt trigger (ST) versions, when the transistors are sized conventionally and unconventionally. ST gates exhibit positive feedback leading to better static noise margins (SNMs), hence less sensitive to noises (i.e., more reliable). The ST concept has lately been used for SRAM cells, with a few papers targeting digital logic. Here we explore the whole voltage and performance range, characterizing SNM, power, delay, and power-delay-product of ST NOR-2 gates, with the aim of getting a better understanding of their advantages for digital logic.",

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AB - This paper looks at a classical CMOS NOR-2 gate as well as Schmitt trigger (ST) versions, when the transistors are sized conventionally and unconventionally. ST gates exhibit positive feedback leading to better static noise margins (SNMs), hence less sensitive to noises (i.e., more reliable). The ST concept has lately been used for SRAM cells, with a few papers targeting digital logic. Here we explore the whole voltage and performance range, characterizing SNM, power, delay, and power-delay-product of ST NOR-2 gates, with the aim of getting a better understanding of their advantages for digital logic.

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KW - reliability

KW - sizing

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On using Schmitt trigger for digital logic

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

Access to Document

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Cite this